RF BIAS SPUTTERING METHOD FOR PRODUCING INSULATING FILMS FREE OF SURFACE IRREGULARITIES

    公开(公告)号:CA1078331A

    公开(公告)日:1980-05-27

    申请号:CA258911

    申请日:1976-08-11

    Applicant: IBM

    Abstract: RF BIAS SPUTTERING METHOD FOR PRODUCING INSULATING FILMS FREE OF SURFACE IRREGULARITIES Using this method an insulating film substantially free from surface irregularities is RF bias sputtered onto a smooth polycrystalline or micro-roughened surface. This is accomplished by controlled resputtering at a first low ratio and then, after a substantially continuous layer of insulative amorphous film is deposited over the substrate, increasing the resputtering to a second higher ratio.

    Smooth electro-insulating layer formation on substrate - by high frequency cathodic sputtering in two stages

    公开(公告)号:FR2353650A1

    公开(公告)日:1977-12-30

    申请号:FR7703518

    申请日:1977-02-01

    Applicant: IBM

    Abstract: During formation of a smooth (roughness 250 A) electroinsulating layer on a polycrystalline, monocrystalline or amorphous substrate (roughness is not >500 angstroms) by high-frequency cathodic sputtering, a part of the deposited material (re-emission coefft.) is removed by the ion bombardment with the loss of a part of the electric energy. The process is improved by forming a first layer of the insulating material at an energy loss coefft. of =1:12 or less (pref, between 1:12-35) and a re-emission coefft. of =0.35 (pref. 0.35-0.15); and then a second layer of the insulating material at an energy loss coefft. of >=1:5 (pref. 1:5-1.5), and a re-emission coefft. of >=0.6 (pref. 0.6-0.8). Different surfaces can be smoothly coated. This is of special importance whom a very thin magnetic layer is to be applied onto the insulating layer, as the properties of such magnetic layers greatly depend on the smoothness of the substrate (e.g. in magnetic heads).

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