Patent search ap:("IBM") AND inv:"SOYCHAK FRANCIS J" Page 1

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发明授权
Test apparatus for determining the opening and closing characteristics of electromagnetic switching devices utilizing logic circuitry 失效
Title translation: 用于使用逻辑电路确定电磁开关装置的开闭特性的测试装置

公开(公告)号：US3253214A

公开(公告)日：1966-05-24

申请号：US16282961

申请日：1961-12-28

Applicant: IBM

Inventor： HEILWEIL MELVIN F , SOYCHAK FRANCIS J

IPC: H04Q1/20

CPC classification number: H04Q1/20

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