Patent search ap:("IBM") AND inv:"STEVEN F OAKLAND" Page 1

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发明专利
Circuit for detecting structural defects in an integrated circuit chip, methods of use and manufacture and design structures 未知

公开(公告)号：GB2501853B

公开(公告)日：2017-02-08

申请号：GB201314831

申请日：2012-01-16

Applicant: IBM

Inventor： LUKE D LACROIX , MARK C H LAMOREY , STEVEN F OAKLAND , JANAK G PATEL , KERRY P PFARR , PETER SLOTA , DAVID B STONE

IPC: G01R31/02 , G01R31/28

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