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公开(公告)号:FR2613094B1
公开(公告)日:1990-02-16
申请号:FR8718197
申请日:1987-12-21
Applicant: IBM
Inventor: LO YUAN-CHANG , SZAREK JOHN JOSEPH , MOELLER DENNIS LEE
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:IN177711B
公开(公告)日:1997-02-15
申请号:IN50DE1988
申请日:1988-01-20
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
IPC: G06F12/00
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公开(公告)号:BE1001067A3
公开(公告)日:1989-06-27
申请号:BE8701440
申请日:1987-12-16
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: Un système de micro-ordinateur comporte des premiers moyens de mémoire d'adresses d'ordre inférieur soudés au panneau de circuits imprimés plan et peut accepter d'autres moyens de mémoire enfichables dans des moyens de connexion sur le panneau. Sous alimentation, en auto-test, on teste les moyens de mémoire et si une erreur est détectée dans le premier moyen de mémoire, ce moyen de mémoire est déconditionné en dirigeant les adresses de mémoire d'ordre le plus bas aux seconds moyens de mémoire et en réduisant les adresses d'ordre le plus élevé du nombre des emplacements dans les premiers moyens de mémoire.
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公开(公告)号:IT1216770B
公开(公告)日:1990-03-08
申请号:IT1955588
申请日:1988-02-26
Applicant: IBM
Inventor: LO YUAN CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:BR8801278A
公开(公告)日:1988-10-25
申请号:BR8801278
申请日:1988-03-22
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:FR2613094A1
公开(公告)日:1988-09-30
申请号:FR8718197
申请日:1987-12-21
Applicant: IBM
Inventor: LO YUAN-CHANG , SZAREK JOHN JOSEPH , MOELLER DENNIS LEE
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:GB2202656A
公开(公告)日:1988-09-28
申请号:GB8725112
申请日:1987-10-27
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:HK33492A
公开(公告)日:1992-05-15
申请号:HK33492
申请日:1992-05-07
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:GB2202656B
公开(公告)日:1991-09-04
申请号:GB8725112
申请日:1987-10-27
Applicant: IBM
Inventor: LO YUAN-CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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公开(公告)号:IT8819555D0
公开(公告)日:1988-02-26
申请号:IT1955588
申请日:1988-02-26
Applicant: IBM
Inventor: LO YUAN CHANG , MOELLER DENNIS LEE , SZAREK JOHN JOSEPH
Abstract: A microcomputer system has first, low order address, memory means (17) soldered to the planar printed circuit board and can accept further memory means (18) pluggable into socket means on the board. At power on self test, the memory means are tested, and, if an error is detected in the first memory means, this memory means is disabled by directing the lowest order memory addresses to the second memory means and reducing the highest order addresses by the number of locations in the first memory means.
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