公开(公告)号：WO2007063029A3

公开(公告)日：2007-08-02

申请号：PCT/EP2006068833

申请日：2006-11-23

Applicant: IBM ,  IBM UK ,  VALLETT DAVID PAUL ,  LEVIN THEODORE ,  KASZUBA PHILLIP

Inventor： VALLETT DAVID PAUL ,  LEVIN THEODORE ,  KASZUBA PHILLIP

IPC: G01R31/28

CPC classification number: G01R1/06705 ,  G01R1/0466 ,  G01R31/2844 ,  G01R31/2886

Abstract: Disclosed is a fault isolation and measurement system that provides multiple near-field scanning isolation techniques on a common platform. The system incorporates the use of a specialized holder (102) to supply electrical bias to internal circuit structures located within an area of a device or material (210) . The system further uses a multi-probe assembly (104) . Each probe is mounted to a support structure around a common reference point (461) and is a component of a different measurement or fault isolation tool. The assembly moves such that each probe can obtain measurements from the same fixed location on the device or material . The relative positioning of the support structure and/or the holder can be changed in order to obtain measurements from multiple same fixed locations within the area. Additionally, the system uses a processor for providing layered images associated with each signal and for precisely aligning those images with design data in order to characterize, or isolate fault locations within the device or material.

Abstract translation: 公开了一种故障隔离和测量系统，该系统在通用平台上提供多个近场扫描隔离技术。 该系统结合使用专用支架（102）来向位于装置或材料（210）的区域内的内部电路结构提供电偏压。 该系统还使用多探针组件（104）。 每个探头安装在围绕公共参考点（461）的支撑结构上，并且是不同测量或故障隔离工具的组件。 组件移动，使得每个探针可以从设备或材料上的相同固定位置获得测量结果。 可以改变支撑结构和/或支架的相对定位，以便从该区域内的多个相同的固定位置获得测量结果。 另外，该系统使用处理器来提供与每个信号相关联的分层图像，并将这些图像与设计数据精确对齐，以表征或隔离设备或材料内的故障位置。

公开(公告)号：WO2007063029B1

公开(公告)日：2007-09-20

申请号：PCT/EP2006068833

申请日：2006-11-23

Applicant: IBM ,  IBM UK ,  VALLETT DAVID PAUL ,  LEVIN THEODORE ,  KASZUBA PHILLIP

Inventor： VALLETT DAVID PAUL ,  LEVIN THEODORE ,  KASZUBA PHILLIP

IPC: G01R31/28

CPC classification number: G01R1/06705 ,  G01R1/0466 ,  G01R31/2844 ,  G01R31/2886

Abstract: Disclosed is a fault isolation and measurement system that provides multiple near-field scanning isolation techniques on a common platform. The system incorporates the use of a specialized holder (102) to supply electrical bias to internal circuit structures located within an area of a device or material (210) . The system further uses a multi-probe assembly (104) . Each probe is mounted to a support structure around a common reference point (461) and is a component of a different measurement or fault isolation tool. The assembly moves such that each probe can obtain measurements from the same fixed location on the device or material . The relative positioning of the support structure and/or the holder can be changed in order to obtain measurements from multiple same fixed locations within the area. Additionally, the system uses a processor for providing layered images associated with each signal and for precisely aligning those images with design data in order to characterize, or isolate fault locations within the device or material.

Abstract translation: 公开了一种在公共平台上提供多个近场扫描隔离技术的故障隔离和测量系统。 该系统包括使用专门的保持器（102）来向位于设备或材料（210）的区域内的内部电路结构提供电偏压。 该系统还使用多探针组件（104）。 每个探头安装到围绕公共参考点（461）的支撑结构，并且是不同测量或故障隔离工具的组件。 组件移动使得每个探针可以从设备或材料上的相同固定位置获得测量值。 可以改变支撑结构和/或保持器的相对定位，以便从区域内的多个相同的固定位置获得测量值。 此外，该系统使用处理器来提供与每个信号相关联的分层图像，并且用于将这些图像与设计数据精确对准，以便表征或隔离设备或材料内的故障位置。

公开(公告)号：JPH11316265A

公开(公告)日：1999-11-16

申请号：JP3826099

申请日：1999-02-17

Applicant: IBM

Inventor： EVANS RICHARD JAMES ,  KASH JEFFREY ALAN ,  KNEBEL DANIEL RAY ,  NIGH PHILLIP J ,  SANDA PIA NAOKO ,  TSANG JAMES CHEN-HSIANG ,  VALLETT DAVID PAUL

IPC: G01R31/302 ,  G01R31/311

Abstract: PROBLEM TO BE SOLVED: To identify the specific place of a device by selecting and supplying logic input for a circuit that allows a navigating element to be switched, and by fetching the image of light emission being generated according to the result of the switching when processing the logic input. SOLUTION: The logic design concept of a circuit is used, a specific input value for triggering a navigating device or a device near the navigating device is selected, and the specific input value is supplied to a chip for performing logic operation in a circuit device. The devices emit light by switching, and the place and time of each switching operation is stored into the memory of a test device. A designer can estimate a specific device to be switched at a specific point of time in the process of a known input value according to the logic design concept of the circuit. When the circuit completes the processing of the input value, the designer can examine the fetched image of a chip in a specific step during the process where it is judged that the navigating device or the nearby device is switched, thus determining the position of the device.

公开(公告)号：DE69922860D1

公开(公告)日：2005-02-03

申请号：DE69922860

申请日：1999-02-08

Applicant: IBM

Inventor： EVANS RICHARD JAMES ,  KASH JEFFREY ALAN ,  KNEBEL DANIEL RAY ,  NIGH PHILLIP J ,  SANDA PIA NAOKO ,  TSANG JAMES CHEN-HSIANG ,  VALLETT DAVID PAUL

IPC: G01R31/302 ,  G01R31/311 ,  G01R31/27 ,  G01R31/28 ,  G01R31/265 ,  G01R31/26

Abstract: A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element. Also in accordance with the invention, the elements to be located can be either actual functional circuit elements, or fiducials added to the chip for test purposes.

公开(公告)号：DE69922860T2

公开(公告)日：2005-12-15

申请号：DE69922860

申请日：1999-02-08

Applicant: IBM

Inventor： EVANS RICHARD JAMES ,  KASH JEFFREY ALAN ,  KNEBEL DANIEL RAY ,  NIGH PHILLIP J ,  SANDA PIA NAOKO ,  TSANG JAMES CHEN-HSIANG ,  VALLETT DAVID PAUL

IPC: G01R31/302 ,  G01R31/311 ,  G01R31/27 ,  G01R31/28 ,  G01R31/265 ,  G01R31/26

Abstract: A system and method for determining the location of a particular device on an integrated circuit chip is described. The system and method utilize apparatus for detecting the emission of light during switching events of devices in the circuit during the circuit's processing of an input calculated to actuate the device whose location is desired. Light emissions from the circuit can be temporally and spatially indexed so as to allow deduction, in combination with the a priori knowledge of the logical operation of the circuit, of the location of the desired element. In another embodiment of the invention, a series of images of the circuit can be accumulated, representing the circuit's response to a series of different input signals, each input signal being designed to result in the switching of the desired element. The series of images can be compared to determine the location of the desired element. Also in accordance with the invention, the elements to be located can be either actual functional circuit elements, or fiducials added to the chip for test purposes.