Bit-line precharge current limiter for CMOS dynamic memories
    1.
    发明公开
    Bit-line precharge current limiter for CMOS dynamic memories 失效
    Bitleitungsvorladungsstrombegrenzer for CMOS dynamische Speicher

    公开(公告)号:EP0732701A3

    公开(公告)日:1998-11-25

    申请号:EP96480016

    申请日:1996-02-06

    Applicant: IBM

    CPC classification number: G11C11/4094

    Abstract: A fault-tolerant DRAM design minimizes current flow in the event of a cross-fail. A bit-line precharge current limiter is provided for the bit-line precharge equalizer circuit. The bit-line precharge current limiter is both simple and effective, requiring very little silicon area to implement. The current limiter provides self current-limiting for defective bit-lines, without the necessity for a reference cell.

    Abstract translation: 容错DRAM设计可以在发生交叉故障时最大限度地减少电流。 为位线预充电均衡器电路提供位线预充电电流限制器。 位线预充电电流限制器既简单又有效,需要很少的硅面积来实现。 电流限制器为有缺陷的位线提供自限流,而不需要参考单元。

    2.
    发明专利
    未知

    公开(公告)号:DE69614905T2

    公开(公告)日:2002-04-04

    申请号:DE69614905

    申请日:1996-02-06

    Applicant: IBM

    Abstract: The memory comprises several word-lines and complementary bit-line pairs. A source of precharge voltage for precharges the complementary bit-line pairs. Several precharge equalisation circuits each of which comprises three field effect transistors. The one FET is connected across a corresponding complementary pair of bit-lines and the other two FET's are connected in series with a respective complementary pair of bit-lines. The gates of each of the FET's are connected to receive a precharge equalisation control signal. The precharge equalisation circuits is connected to the source of the precharge voltage. One precharge equalisation circuit precharges each of the complementary bit-line pairs. A current limiter limits the precharge current flowing into the complementary bit-line pairs to a precharge current limit value. The current limiter comprises a FET which is biased to limit current flow through the transistors to the precharge current limit value.

    3.
    发明专利
    未知

    公开(公告)号:DE69735047D1

    公开(公告)日:2006-03-30

    申请号:DE69735047

    申请日:1997-10-21

    Applicant: IBM TOSHIBA KK

    Abstract: According to the preferred embodiment of the invention, an Address Transition Detector (ATD) pulse generating mechanism is provided that overcomes the limitations of the prior art by compensating for process and power supply voltage variations that would normally effect the pulse width. In particular, the delays used to create the pulse width are adjusted to compensate for the effects of process and environmental variations, thereby providing a pulse width that is relatively constant over these variations.

    4.
    发明专利
    未知

    公开(公告)号:DE69614905D1

    公开(公告)日:2001-10-11

    申请号:DE69614905

    申请日:1996-02-06

    Applicant: IBM

    Abstract: The memory comprises several word-lines and complementary bit-line pairs. A source of precharge voltage for precharges the complementary bit-line pairs. Several precharge equalisation circuits each of which comprises three field effect transistors. The one FET is connected across a corresponding complementary pair of bit-lines and the other two FET's are connected in series with a respective complementary pair of bit-lines. The gates of each of the FET's are connected to receive a precharge equalisation control signal. The precharge equalisation circuits is connected to the source of the precharge voltage. One precharge equalisation circuit precharges each of the complementary bit-line pairs. A current limiter limits the precharge current flowing into the complementary bit-line pairs to a precharge current limit value. The current limiter comprises a FET which is biased to limit current flow through the transistors to the precharge current limit value.

Patent Agency Ranking