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公开(公告)号：JPH11166937A
公开(公告)日：1999-06-22
申请号：JP5859598
申请日：1998-03-10
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
Abstract: PROBLEM TO BE SOLVED: To improve the resolution of a magnetic microscope system by swinging a cantilever in an opposite direction by the interaction between a magnetic field from a magnetic sample and an alternating magnetic field in a probe tip. SOLUTION: An XYZ scanning device maintains the surfaces of a probe tip 20 and a sample 60 at a constant interval at a distance approximately 10-50 nm from the probe tip 20 to a z-direction. Then at the time when the XYZ scanning device moves the sample 60 along a line, a modulator 70 switches current to change the magnetization of the prove tip 20 at a frequency W0 in an opposite direction via a conductive coil 11 and to generate an alternating magnetic filed. The probe tip 20 is vertically swung by the interaction between the alternating magnetic field and the magnetic field of the sample 60. The displacement of the cantilever 50 is detected by a quadrant detector 76, and a lock-in amplifier 78 detects the phase and the peak-to-peak amplitude of the input signal. By this, a magnetic sample is not affected by the stray magnetic field of the conductive coil 11, and the resolution of a magnetic microscope system is improved.
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公开(公告)号：JPH11166936A
公开(公告)日：1999-06-22
申请号：JP5851998
申请日：1998-03-10
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
Abstract: PROBLEM TO BE SOLVED: To improve the resolution of a magnetic microscope system without a magnetic sample being affected by a stray magnetic field from a coil by alternating a probe tip by a magnetic field concentrated to the probe tip. SOLUTION: An XYZ scanning device supports a sample 60, and the probe tip 20 of a probe 10 can be placed at various XY locations of the sample 60. In addition, a modulator 70 generates current pulses of a constant frequency W0 to a conductive coil 11 belonging to the probe 10. Then the laser beam of a laser light source 74 is reflected at the back surface of a cantilever 50. The reflected light is detected by a quadrant detector 76, and a lock-in amplifier 78 measures the phase and the peak to-peak amplitude of the input signal. Its output corresponds to data indicating the signal of the probe 10, and the signal indicates a force caused by the interaction between the magnetic field of the sample 60 and an alternating magnetic field which occurs at the probe tip 20 at the time when a conductive coil 11 is connected to an a.c. current source. Therefore, resolution is improved without being affected by the stray magnetic field of the conductive coil 11.
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公开(公告)号：DE69832651T8
公开(公告)日：2006-11-09
申请号：DE69832651
申请日：1998-02-16
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
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公开(公告)号：DE69823578T2
公开(公告)日：2006-03-23
申请号：DE69823578
申请日：1998-02-16
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
Abstract: A probe (10) for use in an alternating current magnetic force microscopy (MFM) system is located on the free end of a cantilever (50) in the MFM system. The probe (10) has a pair of magnetic poles (P1,P2) that form part of a magnetic yoke and a patterned electrically conductive coil (11) wound through the yoke. The probe (10) includes a probe tip (20) that has a magnetic surface layer that is magnetically coupled to one of the poles and extends from it. When alternating current from the MFM system is passed through the probe coil (11) the magnetisation direction of the probe tip correspondingly alternates. The interaction of these alternating magnetic fields from the probe tip (20) with the magnetic fields emanating from the sample whose magnetic fields are to be measured causes the cantilever (50) to deflect between two extreme positions. The probe (10) can be formed from a portion of a disk drive air-bearing slider with a patterned thin film inductive write head on its trailing end by growing the probe tip (20) from the slider's air-bearing surface (ABS) so as to be in contact with the gap and one of the poles of the write head. The probe (10) can also be part of an integrated single-piece structure that includes the cantilever (50), probe body and probe tip (20) which are formed using conventional thin film deposition and lithographic processes.
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Patent Agency Ranking
公开(公告)号：DE69832651D1
公开(公告)日：2006-01-12
申请号：DE69832651
申请日：1998-02-16
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
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公开(公告)号：DE69823578D1
公开(公告)日：2004-06-09
申请号：DE69823578
申请日：1998-02-16
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
Abstract: A probe (10) for use in an alternating current magnetic force microscopy (MFM) system is located on the free end of a cantilever (50) in the MFM system. The probe (10) has a pair of magnetic poles (P1,P2) that form part of a magnetic yoke and a patterned electrically conductive coil (11) wound through the yoke. The probe (10) includes a probe tip (20) that has a magnetic surface layer that is magnetically coupled to one of the poles and extends from it. When alternating current from the MFM system is passed through the probe coil (11) the magnetisation direction of the probe tip correspondingly alternates. The interaction of these alternating magnetic fields from the probe tip (20) with the magnetic fields emanating from the sample whose magnetic fields are to be measured causes the cantilever (50) to deflect between two extreme positions. The probe (10) can be formed from a portion of a disk drive air-bearing slider with a patterned thin film inductive write head on its trailing end by growing the probe tip (20) from the slider's air-bearing surface (ABS) so as to be in contact with the gap and one of the poles of the write head. The probe (10) can also be part of an integrated single-piece structure that includes the cantilever (50), probe body and probe tip (20) which are formed using conventional thin film deposition and lithographic processes.
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公开(公告)号：AU6049301A
公开(公告)日：2002-01-02
申请号：AU6049301
申请日：2001-06-01
Applicant: IBM
Inventor： TERRIS BRUCE DAVID , WELLER DIETER KLAUS
Abstract: A magnetic recording disk is patterned into discrete magnetic and nonmagnetic regions with the magnetic regions serving as the magnetic recording data bits. The magnetic recording layer comprises two ferromagnetic films separated by a nonferromagnetic spacer film. The spacer film material composition and thickness is selected such that the first and second ferromagnetic films are antiferromagnetically coupled across the spacer film. After this magnetic recording layer has been formed on the disk substrate, ions are irradiated onto it through a patterned mask. The ions disrupt the spacer film and thereby destroy the antiferromagnetic coupling between the two ferromagnetic films. As a result, in the regions of the magnetic recording layer that are ion-irradiated the first and second ferromagnetic films are essentially ferromagnetically coupled so that the magnetic moments from the ferromagnetic films are parallel and produce a magnetic moment that is essentially the sum of the moments from the two films. In the non-irradiated regions of the magnetic recording layer, the first and second ferromagnetic films remain antiferromagnetically coupled so that their magnetic moments are oriented antiparallel. The composition and thicknesses of the first and second ferromagnetic films are selected such that essentially no magnetic field is detectable at a predetermined distance above the magnetic recording layer corresponding to the height that the magnetic recording head would be located.
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公开(公告)号：DE69832651T2
公开(公告)日：2006-07-27
申请号：DE69832651
申请日：1998-02-16
Applicant: IBM
Inventor： MOSER ANDREAS , WELLER DIETER KLAUS
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公开(公告)号：CA2392487A1
公开(公告)日：2001-12-27
申请号：CA2392487
申请日：2001-06-01
Applicant: IBM
Inventor： WELLER DIETER KLAUS , TERRIS BRUCE DAVID , FULLERTON ERIC EDWARD
Abstract: A magnetic recording disk is patterned into discrete magnetic and nonmagneti c regions with the magnetic regions serving as the magnetic recording data bit s. The magnetic recording layer (20) comprises two ferromagnetic films (22, 24) separated by a nonferromagnetic spacer film (26). The spacer film (26) material composition and thickness is selected such that the first and secon d ferromagnetic films (22, 24) are antiferromagnetically coupled across the spacer film (26). After this magnetic recording layer (20) has been formed o n the disk substrate (11), ions (62) are irradiated onto it through a patterne d mask (60). The ions disrupt the spacer film (62) and thereby destroy the antiferromagnetic coupling between the two ferromagnetic films (22, 24). As a result, in the regions (55) of the magnetic recording layer (20) that are io n- irradiated the first and second ferromagnetic films (22, 24) are essentially ferromagnetically coupled so that the magnetic moments from the ferromagneti c films (22, 24) are parallel and produce a magnetic moment that is essentiall y the sum of the moments from the two films (22, 24). In the non-irradiated regions (52, 54) of the magnetic recording layer (20), the first and second ferromagnetic films (22, 24) remain antiferromagnetically coupled so that their magnetic moments are oriented antiparallel. The composition and thicknesses of the first and second ferromagnetic films (22, 24) are selecte d such that essentially no magnetic field is detectable at a predetermined distance above the magnetic recording layer (20) corresponding to the height that the magnetic recording head would be located.
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