公开(公告)号：DE3719200A1

公开(公告)日：1988-12-29

申请号：DE3719200

申请日：1987-06-09

Applicant: IBM DEUTSCHLAND

Inventor： GRESCHNER JOHANN DIPL PHYS DR ,  SCHMID GERHARD DIPL PHYS DR ,  STEINER WERNER DIPL ING ,  TRIPPEL GERHARD DIPL PHYS DR

IPC: B29D17/00 ,  G11B7/24 ,  G11B7/253 ,  G11B7/26 ,  G11B21/06

Abstract: An optical storage disk consists of a glass substrate (1) into which guide tracks (3) for servo-controlling the focussed light beams are directly stamped by a hot stamp process. After stamping, the glass substrate is thermally quenched in the stamping device to increase its breaking resistance through thermal curing. In order to achieve uniform guide tracks over the entire surface of an optical storage disk, flexible stamp stencils (35) in a flexible holder (34) are used whose curvature can be changed by applying hydro-static pressure. Suitable stamp stencils consist of monocristalline silicon disks with surface hardening, or of metal disks, structured in photolithographic processes. The stamp lands are made with bevelled edges to facilitate the separating of stamp and glass substrate after cooling.

公开(公告)号：DE3136887A1

公开(公告)日：1983-03-31

申请号：DE3136887

申请日：1981-09-17

Applicant: IBM DEUTSCHLAND

Inventor： BAYER THOMAS ,  KAUS GERHARD ,  KEMPF JUERGEN DIPL PHYS DR ,  SCHMID GERHARD DIPL PHYS DR

IPC: G01B11/06

Abstract: For the purpose of interferometric measurement of the thickness of a varying layer (10) made from opaque material, use is made of a reference beam (J2) which is reflected at a point of the opaque material which is protected against etching by a transparent layer (11). This reference beam is polarised in the plane of incidence, and is directed onto the transparent layer at the Brewster angle ( theta b). The measuring beam (J1) is polarised at right angles to the plane of incidence and is directed alternately onto the etched part of the opaque material and onto a point of the transparent layer, in order to determine the instantaneous thickness (tm) of the transparent layer (11), which is likewise etched. The instantaneous etched depth (ts) of the opaque material can be determined from the results of the two measuring steps.

公开(公告)号：DE3014718A1

公开(公告)日：1981-10-22

申请号：DE3014718

申请日：1980-04-17

Applicant: IBM DEUTSCHLAND

Inventor： KIENLE HELMUT ,  SCHMID GERHARD DIPL PHYS DR ,  STEINER WERNER ,  TRIPPEL GERHARD DR

IPC: G11B5/66 ,  C09D163/00 ,  G11B5/73 ,  G11B5/738 ,  G11B5/82 ,  G11B5/84 ,  G11B5/85 ,  G11B5/858 ,  H01F10/26 ,  H01F10/30 ,  H01R12/18

Abstract: Multi-layer magnetic thin film disks comprising a synthetic resin layer on an aluminum-containing substrate and an overlying metallic magnetic layer, are liable to have pin holes in the synthetic resin layer caused by galvanic corrosion of the aluminum in the substrate. The pin holes are passivated by aluminum oxide produced therein by anodically oxidizing the aluminum of the substrate in an electrolytic bath, the electric voltage of which is well below the normal passivation voltage for aluminum.