公开(公告)号：WO2018104517A1

公开(公告)日：2018-06-14

申请号：PCT/EP2017/082012

申请日：2017-12-08

Applicant: IMEC VZW

Inventor： LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  VANMEERBEECK, Geert

IPC: G03H1/04 ,  G03H1/00 ,  G03H1/02

Abstract: A method for holographic imaging of an object (106) comprises: driving (302) a laser (102) using a current which is below a threshold current of the laser (102); illuminating (304) the object (106) using illumination light (104) output by the laser (102); and detecting (306) an interference pattern formed by object light, having interacted with the object (106), and reference light of the illumination light (104). An imaging system (100) for holographic imaging is also provided.

公开(公告)号：EP4016191A1

公开(公告)日：2022-06-22

申请号：EP20215954.7

申请日：2020-12-21

Applicant: Imec VZW

Inventor： LIN, Ziduo ,  JAYAPALA, Murali ,  VANMEERBEECK, Geert ,  YURT, Abdulkadir

IPC: G03H1/04

Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:
an array of light sensitive areas sensitive to detect light spanning a wavelength range of at least 400-1200 nm;
at least one light source comprising at least a first point of operation in which the at least one light source is configured to generate visible light, and a second point of operation in which the at least one light source is configured to generate infrared light, and being arranged to illuminate the microscopic object such that light is scattered by the microscopic object;
wherein the array of light sensitive areas is configured to detect an interference pattern formed between the scattered light and non-scattered light;
the device being configured to be set in a selected point of operation from the at least first and second points of operation, for detecting the interference pattern for imaging the microscopic object at a wavelength defined by the selected point of operation.

公开(公告)号：EP3839479A1

公开(公告)日：2021-06-23

申请号：EP19218692.2

申请日：2019-12-20

Applicant: Imec VZW

Inventor： VANMEERBEECK, Geert ,  LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  LAMBRECHTS, Andy

IPC: G01N15/06 ,  G01N1/22 ,  G01N1/40 ,  G03H1/04

Abstract: A device (1) for detecting particles in air; said device (1) comprising:
a receiver (10) for receiving a flow of air (12) comprising particles (2);
a particle capturing arrangement (20) configured to transfer the particles (2) from the flow of air (12) to a liquid for collection of a set of particles (2) in the liquid;
a flow channel (30) configured to pass a flow of the liquid comprising the set of particles (2) through the flow channel;
a light source (40) configured to illuminate the set of particles (2) in the flow channel, such that an interference pattern is formed by interference between light being scattered by the set of particles (2) and non-scattered light from the light source; and
an image sensor (50) comprising a plurality of photo-sensitive elements (52) configured to detect incident light, the image sensor (50) being configured to detect the interference pattern.

公开(公告)号：EP3839474A1

公开(公告)日：2021-06-23

申请号：EP19218696.3

申请日：2019-12-20

Applicant: Imec VZW

Inventor： LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  VANMEERBEECK, Geert ,  LAMBRECHTS, Andy

IPC: G01N1/22 ,  G01N15/02 ,  G01N15/06 ,  G01N15/14 ,  G01N1/28

Abstract: A collector (60, 90, 100) for collecting particles (2) in air, said collector (60, 90, 100) comprising:
a substrate (61), which is adapted to enable imaging of the particles (2);
an adhesive layer (65) arranged on a collector side (62) of the substrate (61), said adhesive layer (65) being formed by an adhesive material;
a protection element (67), which is configured to protect the adhesive layer (65) before collection of particles (2);
wherein the collector (60, 90, 100) is configured to allow release of protection of the adhesive layer (65) by the protection element (67) to expose an adhesive surface (66) of the adhesive layer (65) to ambient air for collecting particles (2) on the adhesive surface (66); and
wherein the collector (60, 90, 100) is further configured for presenting a particle sample carrier (70) having a smooth top surface (68) and a smooth bottom surface (69) for preventing light from being diffusely scattered by the particle sample carrier (70).

公开(公告)号：EP4016190A1

公开(公告)日：2022-06-22

申请号：EP20215951.3

申请日：2020-12-21

Applicant: Imec VZW

Inventor： VANMEERBEECK, Geert ,  LIN, Ziduo ,  JAYAPALA, Murali ,  YURT, Abdulkadir

IPC: G03H1/04 ,  G01N21/00

Abstract: According to an aspect of the present inventive concept there is provided a device for imaging of a microscopic object, the device comprising:
an array of light sensitive areas, each being sensitive to detect light spanning a wavelength range of at least 400-1200 nm;
at least one light source configured to generate light at a plurality of wavelengths within the wavelength range, comprising at least one wavelength in a visible part of the wavelength range and at least one wavelength in a short-wave infrared, SWIR, part of the wavelength range, and arranged to illuminate the microscopic object with the generated light such that at least part of the light is scattered by the microscopic object;
wherein the device is configured to transmit the scattered light and non-scattered light, from the same light source, to the array of light sensitive areas configured to detect an interference pattern formed between the scattered light and the non-scattered light, for each wavelength.

公开(公告)号：EP3839636A1

公开(公告)日：2021-06-23

申请号：EP19218700.3

申请日：2019-12-20

Applicant: Imec VZW

Inventor： STAHL, Richard ,  YURT, Abdulkadir ,  LIN, Ziduo ,  VANMEERBEECK, Geert ,  LAMBRECHTS, Andy

IPC: G03H1/04 ,  G01N15/14 ,  G06K9/00

Abstract: A device (1) for detecting particles (2) in air; said device (1) comprising:
a flow channel (30), wherein the flow channel (30) is configured to allow a flow of air (12) comprising particles (2) through the flow channel (30);
a light source (40) configured to illuminate the particles (2) in the flow of air (12), such that an interference pattern is formed by interference between light being scattered by the particles (2) and non-scattered light from the light source (40);
an image sensor (50) configured to detect incident light, the image sensor (50) being configured to detect the interference pattern, and wherein the image sensor (50) is configured to acquire a time-sequence of image frames, each image frame comprising a plurality of pixels, each pixel representing a detected intensity of light; and
a frame processor (70) configured to filter information in the time-sequence of image frames, wherein said filtering comprises:
identifying pixels of interest in the time-sequence of image frames, said pixels of interest picturing an interference pattern potentially representing a particle (2) in the flow of air (12), and
outputting said identified pixels of interest for performing digital holographic reconstruction on the identified pixels of interest.

公开(公告)号：EP3339963B1

公开(公告)日：2020-08-12

申请号：EP16205862.2

申请日：2016-12-21

Applicant: IMEC vzw

Inventor： YURT, Abdulkadir ,  VANMEERBEECK, Geert ,  STAHL, Richard ,  LIN, Ziduo

IPC: G03H1/00 ,  G03H1/04

公开(公告)号：EP3552060A1

公开(公告)日：2019-10-16

申请号：EP17825408.2

申请日：2017-12-08

Applicant: IMEC VZW

Inventor： LIN, Ziduo ,  YURT, Abdulkadir ,  STAHL, Richard ,  VANMEERBEECK, Geert

IPC: G03H1/04 ,  G03H1/00 ,  G03H1/02

公开(公告)号：EP3382467A1

公开(公告)日：2018-10-03

申请号：EP18163359.5

申请日：2018-03-22

Applicant: IMEC vzw

Inventor： LIN, Ziduo ,  STAHL, Richard ,  YURT, Abdulkadir

IPC: G03H1/02 ,  G03H1/04

CPC classification number: G03H1/02 ,  G02B27/0977 ,  G02B27/22 ,  G03H1/0244 ,  G03H1/0443 ,  G03H1/0465 ,  G03H2001/0212 ,  G03H2001/0447 ,  G03H2001/045 ,  G03H2001/0454 ,  G03H2001/2655 ,  G03H2001/266 ,  G03H2222/13 ,  G03H2222/34 ,  G03H2222/35 ,  G03H2223/23 ,  G03H2226/11

Abstract: A device in, and system for, holographic imaging comprising: at least two light sources (102, 104, 106; 202, 204; 302, 304; 402, 404), wherein each of the at least two light sources is arranged to output light of a unique wavelength; and at least one holographic optical element (110; 208; 308; 410, 412, 414), wherein the at least two light sources and the at least one holographic optical element are arranged in relation to each other such that light from the at least two light sources incident on the at least one holographic optical element is diffractively diverted by the at least one holographic optical element to form wavefronts of similar and registered shape onto an image sensor (114, 210, 312).

公开(公告)号：EP3339963A1

公开(公告)日：2018-06-27

申请号：EP16205862.2

申请日：2016-12-21

Applicant: IMEC vzw

Inventor： YURT, Abdulkadir ,  VANMEERBEECK, Geert ,  STAHL, Richard ,  LIN, Ziduo

IPC: G03H1/00 ,  G03H1/04

Abstract: An apparatus for in-line holographic imaging is provided. The apparatus (100) comprises at least a first light source (102) and a second light source (104) arranged for illuminating an object (108) arranged in the apparatus (100) with a light beam; an image sensor (110) being arranged to detect at least a first and a second interference pattern, wherein the first interference pattern is formed when the object (108) is illuminated by the first light source (102) and the second interference pattern is formed when the object (108) is illuminated by the second light source (104), wherein the first and second interference patterns are formed by diffracted light, being scattered by the object (108), and undiffracted light of the light beam; wherein the at least first and second light sources (102, 104) are arranged at different angles in relation to the object (108), and possibly illuminate the object (108) using different wavelengths.