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    SCREENING DEVICE FOR INTEGRATED CIRCUITS
    2.
    发明申请
    SCREENING DEVICE FOR INTEGRATED CIRCUITS 审中-公开
    屏蔽集成电路

    公开(公告)号：WO02063687A2

    公开(公告)日：2002-08-15

    申请号：PCT/DE0200470

    申请日：2002-02-08

    Applicant: INFINEON TECHNOLOGIES AG ,  AUMUELLER CHRISTIAN ,  JANKE MARCUS ,  HOFREITER PETER

    Inventor： AUMUELLER CHRISTIAN ,  JANKE MARCUS ,  HOFREITER PETER

    IPC: H01L23/58 ,  H01L23/66

    CPC classification number: H01L23/573 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: The invention relates to a screening device comprising means for optical and/or electrical screening which are arranged in the semiconductor chip on the side of the integrated circuit facing the substrate. Preferred embodiments use an SOI substrate with the integrated circuit in the body silicon layer (3) and with the isolator layer (2) as an optical screening device of the bulk silicon layer (1). Electrical conductors (5) can be provided in the bulk silicon layer as an optical and electrical screening device and can be connected to the circuit by means of platings (4).

    Abstract translation: 筛选装置包括用于光学和/或电屏蔽装置，该装置是在面向设置在半导体芯片的集成电路的基板的一侧上。 优选实施例使用在体内具有硅层（3）在所述集成电路和所述绝缘层（2）如（1）前体硅层的光学筛选SOI衬底。 在所述体硅层的电导体（5）的光学和电屏蔽设置有通孔（4）可连接到所述电路。

    4.
    发明专利
    未知

    公开(公告)号：DE10140045A1

    公开(公告)日：2003-03-13

    申请号：DE10140045

    申请日：2001-08-16

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： AUMUELLER CHRISTIAN ,  JANKE MARCUS

    IPC: G06K19/073 ,  G11C16/22 ,  H01L23/552 ,  H01L23/58 ,  H01L27/115 ,  H05K9/00

    Abstract: An IC chip having a protective structure that is distributed over the semiconductor chip in such a manner that it is not possible to trigger a malfunction in the circuit by means of irradiation without the protective structure also being affected by the irradiation. To this end, redundant conductors are provided or connections having radiation-dependent conductivity or dielectric constant are provided or the test lines of a memory are arranged between the bit lines.

    5.
    发明专利
    未知

    公开(公告)号：DE10128573A1

    公开(公告)日：2003-01-02

    申请号：DE10128573

    申请日：2001-06-13

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： ECKSTEIN GERNOT ,  AUMUELLER CHRISTIAN ,  WALLSTAB STEFAN

    IPC: G06F1/00 ,  G06F21/75 ,  G06F21/76 ,  H04L9/10 ,  H04L9/00 ,  G06F1/26

    Abstract: The invention relates to a digital circuit (1) comprising asynchronous circuitry (2), in which the input voltage of the asynchronous circuitry (2) is varied using a random voltage jitter. The random modification of the input voltage causes a temporal jitter in the processing of the individual operations within the asynchronous circuitry, thus preventing individual measurements from being synchronised with the circuitry during side-channel attacks.

    6.
    发明专利
    未知

    公开(公告)号：DE50212016D1

    公开(公告)日：2008-05-15

    申请号：DE50212016

    申请日：2002-02-08

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： AUMUELLER CHRISTIAN ,  JANKE MARCUS ,  HOFREITER PETER

    IPC: H01L23/66 ,  H01L23/58

    Abstract: A shielding device includes optical and/or electrical shielding disposed on the side of the integrated circuit in the semiconductor chip facing the substrate. Preferred configurations use an SOI substrate with the integrated circuit in the body silicon layer and the insulator layer as a device for optical shielding from the bulk silicon layer. Electrical conductors may be present as an optical and electrical shielding device in the bulk silicon layer, and they may be connected to the circuit using vias.

    7.
    发明专利
    未知

    公开(公告)号：DE10140045B4

    公开(公告)日：2006-05-04

    申请号：DE10140045

    申请日：2001-08-16

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： AUMUELLER CHRISTIAN ,  JANKE MARCUS

    IPC: H01L23/58 ,  G06K19/073 ,  G11C16/22 ,  H01L23/552 ,  H01L27/115 ,  H05K9/00

    Abstract: An IC chip having a protective structure that is distributed over the semiconductor chip in such a manner that it is not possible to trigger a malfunction in the circuit by means of irradiation without the protective structure also being affected by the irradiation. To this end, redundant conductors are provided or connections having radiation-dependent conductivity or dielectric constant are provided or the test lines of a memory are arranged between the bit lines.

    8.
    发明专利
    未知

    公开(公告)号：BR9915482A

    公开(公告)日：2001-07-31

    申请号：BR9915482

    申请日：1999-11-18

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： HOFREITER PETER ,  AUMUELLER CHRISTIAN

    IPC: H02M3/07

    Abstract: An energy supply device having an intermediate energy store, a main energy store and a circuit device is provided. The circuit device contains at least two output states, whereby the intermediate energy store is connected to an energy supply input in a first output state and to the main energy store, which is connected to the energy supply output, in a second output state.

    9.
    发明专利
    未知

    公开(公告)号：DE10105725B4

    公开(公告)日：2008-11-13

    申请号：DE10105725

    申请日：2001-02-08

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： AUMUELLER CHRISTIAN ,  HOFREITER PETER ,  JANKE MARCUS

    IPC: H01L23/58 ,  H01L27/12

    Abstract: A shielding device includes optical and/or electrical shielding disposed on the side of the integrated circuit in the semiconductor chip facing the substrate. Preferred configurations use an SOI substrate with the integrated circuit in the body silicon layer and the insulator layer as a device for optical shielding from the bulk silicon layer. Electrical conductors may be present as an optical and electrical shielding device in the bulk silicon layer, and they may be connected to the circuit using vias.

    10.
    发明专利
    未知

    公开(公告)号：AT291754T

    公开(公告)日：2005-04-15

    申请号：AT02762274

    申请日：2002-05-16

    Applicant: INFINEON TECHNOLOGIES AG

    Inventor： ECKSTEIN GERNOT ,  AUMUELLER CHRISTIAN ,  WALLSTAB STEFAN

    IPC: G06F1/00 ,  G06F21/75 ,  G06F21/76 ,  H04L9/10

    Abstract: In a digital circuit comprising an asynchronous circuit, the supply voltage of the asynchronous circuit is varied by means of a random voltage jitter. The random variation of the supply voltage causes a time jitter in the processing of the individual operations within the asynchronous circuit, whereby an artificial synchronizing of individual measurements in side channel attacks is prevented.

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