Patent search ap:("INFINEON TECHNOLOGIES AG") AND inv:"BERGER HARTMUT" Page 1

1.

发明专利
Performance test board for device under test, has DC-DC converter with input terminal to which internal supply sources of test system are connected and output terminal to which power terminal of device under test are connected 未知

公开(公告)号：DE102005055836A1

公开(公告)日：2006-06-01

申请号：DE102005055836

申请日：2005-11-23

Applicant: INFINEON TECHNOLOGIES AG , MDT TECHNOLOGIES GMBH

Inventor： BERGER HARTMUT , EGGERS GEORG , GUPTA KAPIL , KREMER HANS-JOACHIM , PETER CLAUS

IPC: G01R31/28

Abstract: The test board has a DC-DC converter (5) with an input terminal to which multiple internal power supply sources of a test system are connected in parallel. A power supply terminal of the device under test (DUT) is connected an output terminal. An internal power supply source of the test system is connected to a control terminal. A transistor includes a terminal that is connected to the input terminal of the converter.

2.

发明专利
未知

公开(公告)号：DE10137345B4

公开(公告)日：2004-07-08

申请号：DE10137345

申请日：2001-07-31

Applicant: INFINEON TECHNOLOGIES AG

Inventor： ADLER FRANK , BERGER HARTMUT

IPC: G11C29/56 , G11C29/00 , G01R31/3193

Abstract: A test circuit for testing an integrated circuit, includes a test signal input for receiving a test signal from the integrated circuit and a reference signal input for receiving a reference signal. A comparator is in communication with the test signal input and with the reference signal input. The comparator is configured to provide, at a comparator output, an error signal if a comparison between the reference signal and the test signal indicates an error. The error signal, if present, is stored in an error memory, in communication with the comparator output.

3.

发明专利
Testing of DDR-DIMMs using a DQS signal using a circuit that allows expansion of existing test equipment designed for use with SDR (single data rate) DIMMs so that it can be used for testing DDR-DIMMs with DQS signals 未知

公开(公告)号：DE10137345A1

公开(公告)日：2003-02-20

申请号：DE10137345

申请日：2001-07-31

Applicant: INFINEON TECHNOLOGIES AG

Inventor： ADLER FRANK , BERGER HARTMUT

IPC: G11C29/56 , G11C29/00 , G01R31/3193

Abstract: Circuit device (12) for testing an integrated circuit (11), especially a DDR-DIMM using a data query strobe (DQS) signal. Circuit comprises a test signal input (22, 24) for the DQS signal, a reference signal input (18, 20) for input of a reference signal (PDy, PDz) and a comparator (14, 16) for comparison of the test and reference signals and output of a fault signal if indicated by the signal comparison. The fault signal is stored in memory (26, 28), which in turn is connected to a signal output (38). The invention also relates to a corresponding tests system, method and application of the inventive circuit device to testing DDR-DIMMs with a DQS signal.

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