公开(公告)号：DE10121291B4

公开(公告)日：2006-09-28

申请号：DE10121291

申请日：2001-04-27

Applicant: INFINEON TECHNOLOGIES AG

Inventor： MAYR ROMAN ,  SCHELLINGER ANDREAS

IPC: G01R35/00 ,  G01R31/28 ,  G01R31/319

Abstract: A method for calibrating a test apparatus for parallel testing of a number of semiconductor memories, to a time-critical parameter, in which the components are positioned in batches at predetermined test positions and the parameter is measured. The various test positions give different measurement results since they are not identical. These different measurement results are compensated for by the following steps: The invention provides for a position-specific mean value MPS to be formed from batch parameter measurements at each test position, for a position-independent mean value MPU to be formed for the batch parameter measurements at all the test positions, and for a corrected mean value to be obtained for each test position by adding a correction value delta, which is determined from the difference between the position-specific mean value MPS and the position-independent mean value MPU, to the position-specific mean value MPS.

公开(公告)号：DE102005051814A1

公开(公告)日：2007-05-03

申请号：DE102005051814

申请日：2005-10-28

Applicant: INFINEON TECHNOLOGIES AG

Inventor： CHETREANU CHRISTIAN ,  LEBER AMIR ,  MAYR ROMAN ,  GOLLMER STEFAN

IPC: G11C29/56 ,  G01R31/3193

Abstract: The electronic test apparatus (100) has a clock signal generator (301) and a driver (602) has several subunits (302a-302k) each generating a phase-shifted driver signal in response to the clock signal. The phase-shifted driver signals (304a-304k) are processed and actual data being output by a circuit unit is compared with desired data generated in a processor (201). The processor is connected to the circuit unit and transmits the phase-shifted driver signals, the desired data, and the actual data between the processor and the circuit unit. An independent claim is included for a method for testing a circuit unit.

公开(公告)号：DE102006040821A1

公开(公告)日：2008-03-20

申请号：DE102006040821

申请日：2006-08-31

Applicant: INFINEON TECHNOLOGIES AG

Inventor： FRANKOWSKY GERD ,  MAYR ROMAN

IPC: G11C29/04

Abstract: The method involves comparing signal levels of output signals of an integrated circuit with signal levels of reference signals and outputting a comparison signal based on the comparison result. A value of the comparison signal is determined for a preset time period. The determined comparison signal value is evaluated based on a parameter. An error signal is outputted if the determined comparison signal value does not correspond to the parameter. An independent claim is also included for a device for testing an integrated circuit.

公开(公告)号：DE10330042A1

公开(公告)日：2005-02-03

申请号：DE10330042

申请日：2003-06-30

Applicant: INFINEON TECHNOLOGIES AG

Inventor： MAYR ROMAN

IPC: G01R31/3167 ,  G01R31/317 ,  G01R31/319 ,  G11C29/00 ,  G11C29/50 ,  G01R31/28 ,  G01R31/26 ,  G01R31/3193

Abstract: A semiconductor component test system has two test units or separate time discrete functional tests (A1)by comparing digital (A1, 2) bit sequences from the component with reference sequences and time continuous quality tests (A2) of analogue (A2, 2) parameters including skew, duty cycle distortion, jitter and intersymbol interference. Independent claims for a procedure using the test system are included.

公开(公告)号：DE10121291A1

公开(公告)日：2002-11-21

申请号：DE10121291

申请日：2001-04-27

Applicant: INFINEON TECHNOLOGIES AG

Inventor： MAYR ROMAN ,  SCHELLINGER ANDREAS

IPC: G01R31/319 ,  G01R35/00

Abstract: A method for calibrating a test apparatus for parallel testing of a number of semiconductor memories, to a time-critical parameter, in which the components are positioned in batches at predetermined test positions and the parameter is measured. The various test positions give different measurement results since they are not identical. These different measurement results are compensated for by the following steps: The invention provides for a position-specific mean value MPS to be formed from batch parameter measurements at each test position, for a position-independent mean value MPU to be formed for the batch parameter measurements at all the test positions, and for a corrected mean value to be obtained for each test position by adding a correction value delta, which is determined from the difference between the position-specific mean value MPS and the position-independent mean value MPU, to the position-specific mean value MPS.