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公开(公告)号:DE10159797A1
公开(公告)日:2003-03-13
申请号:DE10159797
申请日:2001-12-05
Applicant: INFINEON TECHNOLOGIES AG
Inventor: LINDOLF JUERGEN , WOHLRAB ERDMUTE , TIAN FENG , WEBER UDO
IPC: H01L23/485 , H01L23/58 , H01L21/66
Abstract: A process for forming a contact surface on a semiconductor chip onto which the point of a test board needle (1) can be placed comprises forming the surface (3) in a well (9) in the chip or wafer having a wall (10) bounding the contact surface against which the point of the needle can rest. An Independent claim is also included for a chip as above.