Abstract:
The invention relates to a method for supplying and optimizing a virtual prototype, especially an integrated circuit or a system, said integrated circuit or system and/or an application software that is provided therefor being divided into a plurality of transactions, each of which characterizes a part of the integrated circuit or system associated therewith or a software element. According to the inventive method, one weighting element representing the power consumption of the corresponding part or software element is assigned to a transaction, and the performance is calculated.
Abstract:
The invention relates to a method for supplying and optimizing a virtual prototype, especially an integrated circuit or a system, said integrated circuit or system and/or an application software that is provided therefor being divided into a plurality of transactions, each of which characterizes a part of the integrated circuit or system associated therewith or a software element. According to the inventive method, one weighting element representing the power consumption of the corresponding part or software element is assigned to a transaction, and the performance is calculated.
Abstract:
Disclosed is a method for creating a timing hierarchy in an integrated semiconductor circuit comprising a sequential circuit that is provided with at least two synchronous switching elements with respective timing circuits. The inventive method comprises the following steps: synchronous switching elements having uncritical switching prerequisites regarding a signal arrival time relative to a clock pulse arrival time are determined; the clock pulse arrival time is delayed with the aid of at least one delaying element located in the timing circuit of at least one synchronous switching element having uncritical switching prerequisites so as to minimize the number of synchronous switching elements that simultaneously change the switching mode.
Abstract:
An integrated circuit and an associated packaged integrated circuit are provided which improve testability and reduce the test costs. The integrated circuit contains an integrated functional circuit to be tested, a test interface that connects the functional circuit to a test apparatus which performs a function test on the functional circuit to ascertain a test result, and an integrated self-marking apparatus that produces a marking on the basis of the test result. The marking can be magnetic or optical or electrical, volatile or nonvolatile, and thermally or electrically activated. The test apparatus includes an external test unit or an integrated self-test unit. Nonvolatile memory elements store the test results in a buffer.
Abstract:
An integrated circuit and an associated packaged integrated circuit are provided which improve testability and reduce the test costs. The integrated circuit contains an integrated functional circuit to be tested, a test interface that connects the functional circuit to a test apparatus which performs a function test on the functional circuit to ascertain a test result, and an integrated self-marking apparatus that produces a marking on the basis of the test result. The marking can be magnetic or optical or electrical, volatile or nonvolatile, and thermally or electrically activated. The test apparatus includes an external test unit or an integrated self-test unit. Nonvolatile memory elements store the test results in a buffer.
Abstract:
The invention relates to a separable connecting bridge (fuse) with an electrically conductive, longitudinally continuous conductive track (1) of a given width transversely to its length of a second type of conductivity opposite to the first, said track being formed in a substrate (2, 2a) of a first type of conductivity, where the semiconductor material of the first type of conductivity has a concentration in relation to the material of the conductive track such that, at a predetermined activation temperature which is higher than the operating temperature of the connecting bridge (12, 13), an interruption takes place over the entire width (m) of the conductive track (1) through the diffusion of the semiconductor material of the first type of conductivity and/or the material of the conductive track (1) of the second type of conductivity. 00000
Abstract:
A drive circuit for a non-volatile semiconductor storage configuration. The drive circuit having a level converter circuit which applies an output value and a complementary output value complementary to the output value to a bit line and/or a word line of the semiconductor storage configuration. The drive circuit also has a latch circuit that temporarily stores the data to be stored in the semiconductor storage configuration, and lies between an input circuit and the level converter circuit.
Abstract:
The invention relates to a memory characterized in that it comprises at least one memory cell array containing memory cells, a redundancy circuit containing at least one redundancy memory cell, and a redundancy-selecting line selector circuit having at least one allocation memory in which allocation information can be stored, whereby on the basis of said allocation information at least one redundancy memory cell can be assigned to at least one memory cell. In addition, the allocation memory has an allocation memory cell with an intermediate memory for storing the allocation information. Depending on the programming method used, known memories require relatively long programming periods for assigning redundancy memory cells to memory cells. In the case of the memories provided for by the invention, the allocation information can be transferred from the intermediate memory to the allocation memory cell, thus making it possible for redundancy memory cells to be assigned to defective memory cells rapidly and in an energy-efficient manner.