Abstract:
The present invention provides a system and method for providing reliable transmission in a buffered memory system. The system includes memory devices memory controller, data buffers, an address/command buffer, and a clock circuit. The memory controller sends data, address information, status information and command information, to the memory devices and receives data from the memory devices. The buffers interconnect the memory devices and the memory controller. The clock circuit is embedded in the addr/cmd buffer. The clock circuit takes and input clock and outputs an output clock to the data buffers and/or the memory devices to control clock-shew to the data buffers and/or the memory devices.
Abstract:
A plurality of memory modules interface through a daisy-chain providing a point-to-point connection for each memory module. The first and last memory module in the daisy chain each connect to a separate memory controller port forming a ring circuit. A distinct set of signals connect the memory modules in each direction. A junction circuit in each memory module provides line isolation, a coupling to the adjoining memory modules in the daisy chain, or in the case of the first and last memory module in the daisy chain, a memory module and a memory controller, and a data synchronization circuit. Each junction circuit provides as well as voltage conversion so that the memory devices on a memory module operate at a different voltage than the memory controller, and multiplexing/de-mulitplexing so that a lesser number of lines interfaces with each junction circuit.
Abstract:
Embodiments of the invention are generally directed to systems, methods, and apparatuses for a common memory device for variable device width and scalable pre-fetch and page size. In some embodiments, a common memory device (such as a DRAM) can operate in any of a number of modes including, for example, a x4 mode, a x8 mode, and a x16 mode. The page size provided by the DRAM may vary depending on the mode of the DRAM. In some embodiments, the amount of data pre-fetched by the DRAM also varies depending on the mode of the DRAM.
Abstract:
Embodiments of the invention are generally directed to systems, methods, and apparatuses to save dynamic random access memory (DRAM) self-refresh power. In some embodiments, the refresh frequency of a DRAM is reduced and errors are allowed to occur. In error check mode, the DRAM stores data and corresponding error check bits. The error check bits may be used to scrub the memory and fix the errors.
Abstract:
Method and apparatus for use with buffered memory modules are included among the embodiments. In exemplary systems, a serial presence detect function is included within a memory module buffer instead of being provided by a separate EEPROM device mounted on the memory module. Various embodiments thus can provide cost savings, chip placement and signal routing simplification, and can in some circumstances save pins on the module. Other embodiments are described and claimed.
Abstract:
A method, apparatus, and system to enable a partial refresh scheme for DRAM which includes specifying at least a refresh start value, or a refresh start value and a refresh end value, to reduce the number of rows that must be refreshed during a refresh cycle, thus reducing the amount of power consumed during refresh.
Abstract:
Method and apparatus for use with buffered memory modules are included among the embodiments. In exemplary systems, the memory module has a buffer that receives memory commands and data, and then presents those commands and data to physical memory devices through a separate interface. The buffer has the capability to accept an implicit memory command, i.e., a command that does not contain a fully-formed memory device command, but instead instructs the memory module buffer to form one or more fully-formed memory device commands to perform memory operations. Substantial memory channel bandwidth can be saved, for instance, with a command that instructs a memory module to clear a region of memory or copy a region to a second area in memory. Other embodiments are described and claimed.
Abstract:
A memory component with built-in self test includes a memory array. An input/output interface is coupled to the memory array and has a loopback. A controller is provided to transmit memory array test data to the memory array to store the memory array test data, and to read the memory array test data from the memory array. A compare register is also provided to compare the memory array test data transmitted to the memory array with the memory array test data read from the memory array.