公开(公告)号：GB2457752A

公开(公告)日：2009-08-26

申请号：GB0900831

申请日：2006-06-30

Applicant: INTEL CORP

Inventor： MONFERRER PEDRO CHAPARRO ,  MAGKLIS GRIGORIOS ,  GONZALEZ JOSE ,  GONZALEZ ANTONIO

IPC: G01R21/02 ,  G06F1/32

Abstract: The invention concerns methods and devices for providing leakage power estimation. In one embodiment, one or more detected temperature values (108) and one or more voltage values (110) are used to determine the leakage power of an integrated circuit (IC) component. The invention further relates to other embodiments.

公开(公告)号：GB2457752B

公开(公告)日：2010-05-05

申请号：GB0900831

申请日：2006-06-30

Applicant: INTEL CORP

Inventor： MONFERRER PEDRO CHAPARRO ,  MAGKLIS GRIGORIOS ,  GONZALEZ JOSE ,  GONZALEZ ANTONIO

IPC: G01R21/02 ,  G06F1/32

Abstract: Methods and apparatus to provide leakage power estimation are described. In one embodiment, one or more sensed temperature values (108) and one or more voltage values (110) are utilized to determine the leakage power of an integrated circuit (IC) component. Other embodiments are also described.