公开(公告)号：US06762407B2

公开(公告)日：2004-07-13

申请号：US10089706

申请日：2002-03-29

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: H01J4900

CPC classification number: H01J49/063 ,  H01J49/061 ,  H01J49/421

Abstract: A mass spectrometer having an ion optics system in a first vacuum region, which diverts ions travelling in a first direction from a source, characterized by an initial pressure, through an angle such that neutral particles and photons from the source continue in the first direction and are removed. The diverted ion beam is then directed into a quadrupole mass analyzer arrangement in a second vacuum region, which comprises a set of fringe electrodes followed by a linear mass analyzer and then an ion detector. The first vacuum region is characterized by a pressure intermediate the initial pressure and a second vacuum region pressure. The set of quadrupole fringe electrodes are configured to divert the ion beam prior to passage of the ion beam into the linear quadrupole mass analyzer and to shield the linear quadrupole mass analyzer entrance from a substantial portion of the trajectory of the ion beam in the first vacuum region.

Abstract translation: 一种质谱仪，其具有在第一真空区域中具有离子光学系统的离子光学系统，该离子光学系统将离开源的第一方向的离子转移，其特征在于初始压力，使得来自源的中性粒子和光子沿第一方向继续; 被删除。 然后将转移的离子束引导到第二真空区域中的四极质量分析器装置中，该第二真空区域包括一组边缘电极，随后是线性质量分析器，然后是离子检测器。 第一真空区域的特征在于初始压力和第二真空区域压力之间的压力。 该组四极条纹电极被配置为在离子束通过线性四极杆质量分析仪之前转移离子束，并且将线性四极杆质量分析器入口从第一真空中离子束轨迹的实质部分屏蔽 地区。

公开(公告)号：US09202679B2

公开(公告)日：2015-12-01

申请号：US13988511

申请日：2011-11-25

Applicant: Iouri Kalinitchenko ,  Peter Zdaril

Inventor： Iouri Kalinitchenko ,  Peter Zdaril

IPC: H01J49/06 ,  H01J49/10

CPC classification number: H01J49/06 ,  H01J49/067 ,  H01J49/105

Abstract: There is provided a sampling interface for use with a mass spectrometry apparatus. The sampling interface is arranged so as to enable the sampling of ions in a mass spectrometer. In one aspect, the sampling interface comprises an inlet for receiving a quantity of ions from an ion source, and a region downstream of the inlet for accommodating a gas through which the ions may pass, wherein a field having a selected bias voltage potential is provided in at least a portion of the downstream region through which the ions may pass.

Abstract translation: 提供了用于质谱装置的采样接口。 采样接口被布置成能够在质谱仪中对离子进行采样。 在一个方面，采样接口包括用于从离子源接收一定量的离子的入口和用于容纳离子可以通过的气体的入口下游的区域，其中提供具有选定的偏置电压电位的场 在离子可以通过的下游区域的至少一部分中。

公开(公告)号：US07038199B2

公开(公告)日：2006-05-02

申请号：US10489215

申请日：2004-03-09

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: H01J49/06

CPC classification number: H01J49/08

Abstract: A mass spectrometer and method of mass spectrometry in which polyatomic and doubly charged ion interferences are attenuated by establishing an electron population through which a beam of particles containing elemental sample ions and the interfering ions is passed such that the interfering ions preferentially undergo ion-electron recombination and thus dissociation to remove a significant number of the interfering ions. Means (30 or 32) for providing a population of electrons (34 or 36) in an ICP-MS (22) may comprise a magnetic field means such as an electric coil, or an electron generating device. The population of electrons has an electron number density (>1011 cm−3 to 1014 cm−3), a free electron energy (>0.01 eV to

Abstract translation: 通过建立电子群减少多原子和双电荷离子干扰的质谱仪和质谱法，通过该质谱仪将含有元素样品离子和干扰离子的粒子束通过，使得干扰离子优先进行离子电子重组 并因此解离以除去大量的干扰离子。 用于在ICP-MS（22）中提供电子群体（34或36）的装置（30或32）可以包括诸如电线圈或电子产生装置的磁场装置。 电子群体具有电子数密度（> 10×10 -3 cm -3至10 14 cm -3 -3 / ），在低压（<10Torr）的区域中的自由电子能量（> 0.01eV至<5eV），使得通过电子群体的离子的预定路径长度（1-4cm）， 干扰离子将优先通过解离复合过程减弱。 离子束（40）然后通过质量分析器（42），并且通过离子检测器（44）检测已经根据其质荷比分离的离子。

公开(公告)号：US20130248701A1

公开(公告)日：2013-09-26

申请号：US13988511

申请日：2011-11-25

Applicant: Iouri Kalinitchenko ,  Peter Zdaril

Inventor： Iouri Kalinitchenko ,  Peter Zdaril

IPC: H01J49/06

CPC classification number: H01J49/06 ,  H01J49/067 ,  H01J49/105

Abstract: There is provided a sampling interface for use with a mass spectrometry apparatus. The sampling interface is arranged so as to enable the sampling of ions in a mass spectrometer. In one aspect, the sampling interface comprises an inlet for receiving a quantity of ions from an ion source, and a region downstream of the inlet for accommodating a gas through which the ions may pass, wherein a field having a selected bias voltage potential is provided in at least a portion of the downstream region through which the ions may pass.

Abstract translation: 提供了用于质谱装置的采样接口。 采样接口被布置成能够在质谱仪中对离子进行采样。 在一个方面，采样接口包括用于从离子源接收一定量的离子的入口和用于容纳离子可以通过的气体的入口下游的区域，其中提供具有选定的偏置电压电位的场 在离子可以通过的下游区域的至少一部分中。

公开(公告)号：US20070063137A1

公开(公告)日：2007-03-22

申请号：US10574569

申请日：2004-10-06

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: H01J49/00

CPC classification number: H01J49/4215 ,  H01J49/063

Abstract: An electrode for use in a reduced pressure region in a mass spectrometer whereby the electrode is subject to deposition of dielectric (non-conducting) substances thereon, which can cause unstable performance of the mass spectrometer. The surface portion of the electrode that is for providing an equipotential boundary of an electric field for influencing charged particles is made rough, in contrast to the prior art of providing a polished surface. The rough surface provides projections and cavities, which may have a regular or irregular occurrence, which it has been found significantly reduces the deposition of dielectric substances from the charged particles thereon. A preferred structure is for a rod electrode (42) to have a screw thread (44) formed thereon whereby the thread crests (43) along the rod electrode provide projections (43) and the thread roots (45) provide cavities.

Abstract translation: 用于质谱仪中的减压区域的电极，由此电极在其上沉积介电（非导电）物质，这可能导致质谱仪的不稳定性能。 与提供抛光表面的现有技术相反，用于提供用于影响带电粒子的电场的等电势边界的电极的表面部分是粗糙的。 粗糙表面提供可能具有规则或不规则发生的突起和空腔，已经发现它们显着地减少了介电物质从其上的带电粒子的沉积。 优选的结构是用于杆形电极（42）具有形成在其上的螺纹（44），由此沿杆电极的螺纹孔（43）提供突起（43），螺纹根部（45）提供空腔。

公开(公告)号：US07119330B2

公开(公告)日：2006-10-10

申请号：US10506142

申请日：2003-02-27

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: H01J49/40

CPC classification number: H01J49/067 ,  H01J49/105

Abstract: A plasma source mass spectrometer (20) having an ion beam extraction electrode (45) associated with a skimmer cone (40) to restrict the pumping of gas from a region (60) immediately behind the skimmer cone orifice (42) to provide a higher pressure (e.g. 1–10−2 Torr) in the region (60) compared to the pressure downstream of the electrode (45) (e.g. 10−3–10−4 Torr). This provides a collisional gas volume (60) for plasma (28) for attenuating polyatomic and multicharged interfering ions prior to extraction of an ion beam (49). In one embodiment a substance (e.g. hydrogen) can be supplied into the region (60) to assist attenuation of polyatomic and multicharged interfering ions by reactive or collisional interactions.

Abstract translation: 一种等离子体源质谱仪（20），其具有与分离器锥体（40）相关联的离子束引出电极（45），以限制从紧挨着分离器锥形孔口（42）的后面的区域（60）泵送气体，以提供更高的 与电极（45）下游的压力相比，区域（60）中的压力（例如，1-10Pa -2 Torr）（例如10 -3 -3℃） > -4乇）。 这提供了用于在提取离子束（49）之前衰减多原子和多电荷干扰离子的等离子体（28）的碰撞气体体积（60）。 在一个实施方案中，可以将物质（例如氢）供应到区域（60）中，以通过反应性或碰撞相互作用来辅助多原子和多电荷干扰离子的衰减。

公开(公告)号：US20050269506A1

公开(公告)日：2005-12-08

申请号：US10523186

申请日：2003-07-29

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: G01N27/62 ,  H01J49/00 ,  H01J49/10 ,  H01J49/26

CPC classification number: H01J49/105 ,  H01J49/067

Abstract: A mass spectrometer in which a substance is introduced into a plasma (28) which contains analyte ions as the plasma (28) is passing through an aperture (42), for example in a skimmer cone (40) between two vacuum regions (38) and (44) so that the substance interacts with the plasma (28) thereby reducing the concentration of interfering polyatomic or multicharged ions in the plasma by reactive or collisional interactions. The substance may be supplied via passage (60) having an outlet (63) in skimmer cone (40). The invention gives improved attenuation of interfering ions because the substance is supplied directly into the plasma (28) as it is substantially radially confined by aperture (42) and before an ion beam (58) is extracted. Alternatively or additionally a substance may be supplied directly into the plasma within aperture (36) in sampling cone (34).

Abstract translation: 其中物质被引入等离子体（28）中的质谱仪，其中包含作为等离子体（28）的分析物离子通过孔（42），例如在两个真空区域（38）之间的分离器锥体（40）中， 和（44），使得物质与等离子体（28）相互作用，由此通过反应性或碰撞相互作用降低等离子体中干扰的多原子或多电荷离子的浓度。 物质可以通过具有在撇渣器锥体（40）中的出口（63）的通道（60）供应。 本发明提供了改善的干扰离子的衰减，因为物质直接供应到等离子体（28）中，因为其基本上径向地被孔（42）限制，并且在离子束（58）被提取之前。 或者或另外，物质可以在采样锥体（34）中的孔（36）内直接供应到等离子体中。

公开(公告)号：US06614021B1

公开(公告)日：2003-09-02

申请号：US09787773

申请日：2001-03-21

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: B01D5944

CPC classification number: H01J49/061

Abstract: A mass spectrometer having an ion reflecting instead of ion transmissive optics system. The spectrometer includes an ion source (16) for providing a beam of sample particles including ions along an axis (24). Its ion optics system (34-46) establishes a reflecting electrostatic field for reflecting ions along a path (30) from the particle beam and focussing them at an entrance aperture (26) of a mass analyser (25) and ion detector (27) for spectrometric analysis. The invention allows more efficient separation of ions from neutral particles, gives better signal to noise ratios and allows for a compact “optical” path and thus cheaper instrument to be manufacctured. The reflecting electrostatic field can also be used to filter higher energy ions from lower energy ions. An ion optical system as such is also disclosed.

Abstract translation: 具有离子反射而不是离子透射光学系统的质谱仪。 光谱仪包括用于提供沿着轴线（24）包括离子的样品颗粒束的离子源（16）。 其离子光学系统（34-46）建立反射静电场，用于沿着来自粒子束的路径（30）反射离子，并将其聚焦在质量分析器（25）和离子检测器（27）的入口孔（26） 进行光谱分析。 本发明允许离子与中性粒子更有效地分离，提供更好的信噪比，并且允许紧凑的“光学”路径并因此制造便宜的仪器。 反射静电场也可用于从较低能量离子过滤更高能量的离子。 本发明还公开了一种离子光学系统。

公开(公告)号：US09006646B2

公开(公告)日：2015-04-14

申请号：US13993709

申请日：2012-01-25

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: B01D59/44 ,  H01J49/00 ,  H01J49/10

CPC classification number: H01J49/0013 ,  H01J49/061 ,  H01J49/105 ,  H01J49/24

Abstract: There is provided a mass spectrometry apparatus comprising: an ion source arranged in a substantially horizontal orientation and from which a quantity of ions may be sourced, an ion filter device arranged for receiving a stream of ions for filtering thereof; and, an ion guide arranged so as to guide ions sourced from the ion source toward the ion filter device. The ion source and the ion filter device are arranged relative to one another so that the profile of the apparatus is reduced so as to minimize the effective footprint of the apparatus.

Abstract translation: 提供了一种质谱装置，其包括：离子源，其基本上水平的方向布置，并且可以从其中获得一定量的离子;离子过滤器装置，被布置成用于接收用于过滤的离子流; 以及离子导向器，其被布置成将源自离子源的离子引导到离子过滤器装置。 离子源和离子过滤装置相对于彼此布置，使得装置的轮廓减小，以便最小化装置的有效占地面积。

公开(公告)号：US07351962B2

公开(公告)日：2008-04-01

申请号：US10574569

申请日：2004-10-06

Applicant: Iouri Kalinitchenko

Inventor： Iouri Kalinitchenko

IPC: B01D59/44

CPC classification number: H01J49/4215 ,  H01J49/063

Abstract: An electrode for use in a reduced pressure region in a mass spectrometer whereby the electrode is subject to deposition of dielectric (non-conducting) substances thereon, which can cause unstable performance of the mass spectrometer. The surface portion of the electrode that is for providing an equipotential boundary of an electric field for influencing charged particles is made rough, in contrast to the prior art of providing a polished surface. The rough surface provides projections and cavities, which may have a regular or irregular occurrence, which it has been found significantly reduces the deposition of dielectric substances from the charged particles thereon. A preferred structure is for a rod electrode (42) to have a screw thread (44) formed thereon whereby the thread crests (43) along the rod electrode provide projections (43) and the thread roots (45) provide cavities.

Abstract translation: 用于质谱仪中的减压区域的电极，由此电极在其上沉积介电（非导电）物质，这可能导致质谱仪的不稳定性能。 与提供抛光表面的现有技术相反，用于提供用于影响带电粒子的电场的等电势边界的电极的表面部分是粗糙的。 粗糙表面提供可能具有规则或不规则发生的突起和空腔，已经发现它们显着地减少了介电物质从其上的带电粒子的沉积。 优选的结构是用于杆形电极（42）具有形成在其上的螺纹（44），由此沿杆电极的螺纹孔（43）提供突起（43），螺纹根部（45）提供空腔。