公开(公告)号：WO2008048312A3

公开(公告)日：2008-10-30

申请号：PCT/US2006047654

申请日：2006-12-14

Applicant: J A WOOLLAM CO INC

Inventor： LIPHARDT MARTIN M ,  JOHS BLAINE D ,  HERZINGER CRAIG M ,  HE PING ,  GOEDEN CHRISTOPHER A ,  WOLLAM JOHN A ,  WELCH JAMES D

IPC: G02B3/14

CPC classification number: G01N21/211 ,  G01J3/0208 ,  G01N21/55 ,  G01N2021/213

Abstract: Disclosed are system for and method of analyzing asample at substantially the exact same small spot point on a sample with a plurality of wavelengths.

Abstract translation: 公开了在具有多个波长的样本上基本上完全相同的小斑点处分析样本的系统和方法。