公开(公告)号：EP1933152A1

公开(公告)日：2008-06-18

申请号：EP06797052.5

申请日：2006-08-30

Applicant: Japan Science and Technology Agency

Inventor： TSUJI, Kouichi ,  KITAMORI, Takehiko ,  TOKESHI, Manabu ,  TANAKA, Keita ,  NAKANO, Kazuhiko

IPC: G01N35/08 ,  G01N23/223 ,  G01N37/00

CPC classification number: G01N23/223 ,  B01L3/502715 ,  B01L3/502792 ,  B01L2300/0867 ,  B01L2300/0887 ,  B01L2300/089 ,  B01L2300/161 ,  G01N2223/076

Abstract: A plurality of elements can be analyzed simultaneously with high sensitivity using a microchip. The microchip (1) comprises a substrate (30), a channel (23) formed in the substrate (30), and an analyzing part (10) consisting of a part of flat surface of the substrate (30), where the outlet of the channel (23) is formed as an opening (9c) and measurement object liquid overflowed from the opening (9c) stays on the flat surface of the substrate (30) to become a sample of analysis. The measurement object liquid is made to overflow as a sample of analysis to the analyzing part (10) using the microchip (1) and then the sample of analysis is preferably dried before a primary X-ray is made to enter under conditions of total reflection and fluorescent X-rays are detected.

Abstract translation: 可以使用微芯片以高灵敏度同时分析多个元件。 微芯片（1）包括基板（30），形成在基板（30）中的通道（23）和由基板（30）的平坦表面的一部分组成的分析部件（10） 通道（23）形成为开口（9c），并且从开口（9c）溢出的测量对象液体停留在基板（30）的平坦表面上，以成为分析样本。 使用微芯片（1）使测量对象液体作为分析样品作为分析样品溢出，然后优选在初步X射线在全反射条件下进入分析样品之前进行干燥 并检测荧光X射线。