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1.发明授权System and methods to determine and monitor changes in microstructural properties 有权确定和监测微观结构特性变化的系统和方法公开(公告)号：US07942058B2
公开(公告)日：2011-05-17
申请号：US12079925
申请日：2008-03-28
Applicant: Joseph Alan Turner
Inventor： Joseph Alan Turner
CPC classification number: G01L1/255 , B61K9/08 , G01N29/04 , G01N29/12 , G01N29/2418 , G01N29/4445 , G01N2291/02881 , G01N2291/102 , G01N2291/105 , G01N2291/2623
Abstract: A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
Abstract translation: 可以随时间确定和监测材料的微观结构特性如晶粒尺寸，晶粒伸长率，纹理和孔隙度等变化的系统和方法，以评估应力和缺陷等条件。 本发明包括数据库，其中第一组数据用于与第二组数据进行比较，以确定材料微观结构的条件。
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2.发明申请SYSTEM AND METHODS TO DETERMINE AND MONITOR CHANGES IN MICROSTRUCTURAL PROPERTIES 审中-公开微结构特性决定和监测变化的系统和方法公开(公告)号：US20110098942A1
公开(公告)日：2011-04-28
申请号：US12984291
申请日：2011-01-04
Applicant: Joseph Alan Turner
Inventor： Joseph Alan Turner
CPC classification number: G01L1/255 , B61K9/08 , G01N29/04 , G01N29/12 , G01N29/2418 , G01N29/4445 , G01N2291/02881 , G01N2291/102 , G01N2291/105 , G01N2291/2623
Abstract: A system and methods with which changes in microstructure properties such as grain size, grain elongation, texture, and porosity of materials can be determined and monitored over time to assess conditions such as stress and defects. An example system includes a number of ultrasonic transducers configured to transmit ultrasonic waves towards a target region on a specimen, a voltage source configured to excite the first and second ultrasonic transducers, and a processor configured to determine one or more properties of the specimen.
Abstract translation: 可以随时间确定和监测材料的微观结构特性如晶粒尺寸，晶粒伸长率，纹理和孔隙度等变化的系统和方法，以评估应力和缺陷等条件。 示例性系统包括多个超声波换能器，其配置成朝向样本上的目标区域发射超声波，配置成激发第一和第二超声波换能器的电压源以及被配置为确定样本的一个或多个特性的处理器。
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3.发明申请System and methods to determine and monitor changes in microstructural properties 有权确定和监测微观结构特性变化的系统和方法公开(公告)号：US20090056454A1
公开(公告)日：2009-03-05
申请号：US12079925
申请日：2008-03-28
Applicant: Joseph Alan Turner
Inventor： Joseph Alan Turner
IPC: G01N29/11
CPC classification number: G01L1/255 , B61K9/08 , G01N29/04 , G01N29/12 , G01N29/2418 , G01N29/4445 , G01N2291/02881 , G01N2291/102 , G01N2291/105 , G01N2291/2623
Abstract: The present invention is directed to a system and methods with changes in microstructure properties such as grain size, grain elongation, texture, and porosity, of materials can be determined and monitored over time to assess conditions such as stress and defects. The present invention includes a database of data, wherein a first set of data is used for comparison with a second set of data to determine the conditions of the material microstructure.
Abstract translation: 本发明涉及随着时间的推移可以确定和监测材料的微观结构特性如晶粒尺寸，晶粒伸长率，纹理和孔隙度等变化的系统和方法，以评估诸如应力和缺陷的条件。 本发明包括数据库，其中第一组数据用于与第二组数据进行比较，以确定材料微观结构的条件。
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