公开(公告)号：EP2982969A4

公开(公告)日：2017-03-01

申请号：EP14778804

申请日：2014-04-01

Applicant: KOHYOUNG TECH INC

Inventor： LEE HYUN-SEOK ,  YANG JAE-SIK ,  KIM JA-GEUN ,  KIM HEE-TAE ,  YOU HEE-WOOK

IPC: G01N21/88 ,  G01B11/25 ,  G01N21/94 ,  G01N21/956 ,  G06T7/00

CPC classification number: G01N21/94 ,  G01N21/8806 ,  G01N2021/8845 ,  G01N2021/95638 ,  G01N2201/061 ,  G01N2201/13 ,  G06T7/001 ,  G06T11/60 ,  G06T2207/10004 ,  G06T2207/10024 ,  G06T2207/30141

Abstract: In order to inspect a substrate, an image information of a substrate before applying solder is displayed. Then, at least one inspection region on the substrate is image-captured to obtain an image of the inspection region that is image-captured. Then, image information that is to be displayed is renewed and the renewed image information is displayed. And, in order to inspect a foreign substance, obtained image of the inspection region is compared with a reference image of the substrate. Therefore, an operator can easily catch a region corresponding to a specific region of the image that is displayed, and easily detect a foreign substance on the substrate.