公开(公告)号：EP0123828A1

公开(公告)日：1984-11-07

申请号：EP84102217.1

申请日：1984-03-02

Applicant: KOLLMORGEN TECHNOLOGIES CORPORATION

Inventor： Burr, Robert Page ,  Keogh, Raymond J. ,  Morino, Ronald ,  Crowell, Jonathan C. c/o PCK Technology ,  Burr, James B. ,  Christophersen, James C.

IPC: G01R31/28 ,  G01R27/02

CPC classification number: G01R31/088 ,  G01R31/2805 ,  G01R31/312

Abstract: A method and apparatus for testing circuit boards using two or a small number of probes for making resistive and radio frequence impedance measurements, e.g., capacitive measurements. The combination of resistive and impedance measurements substantially reduces the number of tests required to verify the integrity of a circuit board. The impedance of capacitive "norm" values used in testing the circuit boards can be obtained by operating the system in a learning mode. Analysis of the data provides not only fault detection but can also indicate approximate fault location.

公开(公告)号：EP0123828B1

公开(公告)日：1987-09-16

申请号：EP84102217.1

申请日：1984-03-02

Applicant: KOLLMORGEN TECHNOLOGIES CORPORATION

Inventor： Burr, Robert Page ,  Keogh, Raymond J. ,  Morino, Ronald ,  Crowell, Jonathan C. c/o PCK Technology ,  Burr, James B. ,  Christophersen, James C.

IPC: G01R31/28 ,  G01R27/02

CPC classification number: G01R31/088 ,  G01R31/2805 ,  G01R31/312