Abstract:
First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattered light emitted from the surrounding region, is disposed in a chip holder. Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected.
Abstract:
In the present invention, excitation light is irradiated onto an analysis chip that has been placed in a chip holder, reflected light or transmitted light from the analysis chip is detected, and as a result the position information of the analysis chip is obtained. On the basis of this position information, the chip holder is moved by a conveyance stage and thereby moved to a measurement position. Excitation light is irradiated onto the analysis chip that is disposed at the measurement position, and fluorescence emitted from a fluorescent substance that marks the substance to be detected is detected.