MOS DEVICE AND MANUFACTURE THEREOF

    公开(公告)号:JPH08130310A

    公开(公告)日:1996-05-21

    申请号:JP30790394

    申请日:1994-12-12

    Abstract: PURPOSE: To prevent the effect of a short channel that is a problem being generated from a MOS element where the length of a channel becomes short owing to the high integration of an integrated circuit, the increase in resistance of a source and a drain, and the decrease in the reliability of an element due to, for example, the junction breakdown caused by a metal wiring and an electromigration. CONSTITUTION: A gate electrode 9 in a groove form or in other forms is formed between a gate electrode 4 and a source/drain 7 for securing the depth of the junction of the source and drain that are as deep as the depth of the groove. Therefore, by injecting an impurity with a specific concentration below a gate electrode in groove structure and adjusting the concentration of the impurity, electrical characteristics such as a threshold voltage and a leakage current can be adjusted.

    FIELD-EFFECT ELEMENT AND FORMATION METHOD OF ITS ELECTRODE

    公开(公告)号:JPH08162636A

    公开(公告)日:1996-06-21

    申请号:JP31538894

    申请日:1994-12-19

    Abstract: PURPOSE: To provide a field-effect element and its electrode forming method capable for forming the electric contacts of an element aligning them automatically, without a contact hole forming process, in a wiring process between electrodes of a kind of silicon, metal or different kinds of metals. CONSTITUTION: Parts of an insulating film 48 on field oxide films 40 and on parts where electrode contacts of wiring electrodes, electrodes of a kind of silicon, electrodes of different kinds of metals are formed are removed, and only parts surrounding the region of a gate electrode, i.e., gate oxide films 48a, 48b are left unremoved. And a substance for wiring electrodes is applied, and the substance is patterned after that and wiring electrodes 49 are formed.

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