Abstract:
본 발명은 단일 편광자 초점 타원계측기(single-polarizer focused-beam ellipsometer)에 관한 것으로, 보다 상세하게는 하나의 편광용 광분할기가 편광 발생장치, 광분할기 및 편광 검출장치의 역할을 하도록 간편화된 구조를 갖으며 다중 입사면 측정을 다중 입사각에 적용하는 측정방법을 채택함으로써 측정 정밀도가 향상된 초점 타원계측기에 관한 것인데 시편에 의해 반사된 빛의 편광상태 변화를 측정함으로써 시편의 광물성, 즉 박막 시편의 경우에는 박막의 두께 및 굴절률 등에 대한 정확한 정보들을 분석해낼 수 있는 측정기술이다. 이를 위하여 본 발명의 타원계측기는 광원(light source); 상기 광원으로부터 방출된 빛을 편광된 빛으로 분할하는 편광용 광분할기(polarizing beamsplitter); 상기 편광용 광분할기로부터 분할된 일부의 빛을 굴절시켜 시편에 집중시켜 조사시키는 대물렌즈(objective lens); 상기 시편으로부터 반사된 후 상기 대물렌즈 및 상기 편광용 광분할기를 통과한 빛을 수광하는 광검출기(photodetector); 상기 광검출기에 의해 검출된 빛의 세기(light intensity)를 다중 입사면 경로를 따라 상기 광검출기의 단위소자(pixel)에 해당되는 값으로 보정하여 연산처리하는 연산처리장치(central processing unit)를 포함하는 것을 특징으로 한다. 단일, 편광자, 초점, 타원계측기, 편광용 광분할기
Abstract:
Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer, in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer so as to generate SPR according to an angle change of the polarized light; and a flow unit which supplies a buffer solution containing a bio material binding to or dissociation from the metal thin film generating surface plasmon, wherein the SPR and the ellipsometric phase change by change in an angle and a wavelength are simultaneously detected.
Abstract:
The present invention relates to an ellipsometer using a half-mirror, and more particularly, to an ellipsometer using a half-mirror, in which, instead of using rectangular prism type or glass plate type beam splitter that transmits some of the light and reflects the rest of the light as in a conventional vertical incident type focused-beam ellipsometer, the light is reflected to half of the object lens by a half-mirror and the light reflected from the half of the focus of the object lens is not transmitted through the beam splitter but is detected directly by a photodetector, and thus light interference due to the beam splitter is prevented and the light intensity is increased to maximally four times to thereby allow more accurate and precise measurement and analysis of physical properties for a sample of nanofilm or nano-pattern.
Abstract:
Provided is a multi-channel surface plasmon resonance sensor using beam profile ellipsometry; and, more particularly, to a high sensitive measuring technology, which is coupled with a vertical illumination type focused-beam ellipsometer using a multi-incident angle measurement method, and a surface plasmon resonance (SPR) sensing part deposited with a metal thin film. The multi-channel surface plasmon resonance sensor includes a vertical illumination type focused-beam ellipsometer in which light is polarized; a surface plasmon resonance (SPR) sensing part which is provided at the objective lens part of the focused-beam ellipsometer; and a multi-channel flow unit which supplies a buffer solution containing a bio material binding to or dissociation from a metal thin film generating surface plasmon.