公开(公告)号：KR100653576B1

公开(公告)日：2006-11-28

申请号：KR20060049408

申请日：2006-06-01

Applicant: KOREA RES INST OF STANDARDS

Inventor： KANG JEON HONG ,  YU KWANG MIN ,  KIM HAN JUN

IPC: G01R27/00

CPC classification number: G01R27/02 ,  G01K7/16

Abstract: A metal conductivity measurement electrode and a temperature controller using van der pauw are provided to precisely estimate various metal conductivities by implementing a temperature control device to control temperature within a measurement chamber. A temperature chamber(100) includes a temperature control unit, which generates cool and hot air in order to reach a predetermined temperature condition. Plural test jigs are freely moved between a test piece and the corner of a support plate(30) within the temperature chamber, and fixed on the support plate according to the size of the test piece. Plural test piece measuring units are formed on the test jigs, and contacted to the test piece in order to measure voltage from the corner of the test piece. A test piece height control unit controls the height of the test piece according to the thickness of the test piece.

Abstract translation: 提供金属导电性测量电极和使用范德瓦的温度控制器以通过实施温度控制装置来精确估计各种金属电导率来控制测量室内的温度。 温度室（100）包括温度控制单元，其产生冷热空气以达到预定温度条件。 多个测试夹具在试验片和温室内的支撑板（30）的角部之间自由移动，并根据试件的尺寸固定在支撑板上。 多个试件测量单元形成在测试夹具上，并与测试件接触，以测量试件角部的电压。 测试件高度控制单元根据测试件的厚度控制测试件的高度。