公开(公告)号：WO2013141539A1

公开(公告)日：2013-09-26

申请号：PCT/KR2013/002175

申请日：2013-03-18

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： KIM, Jae-Wan ,  KIM, Jong-Ahn ,  JIN, Jong-Han ,  KANG, Chu-Shik ,  EOM, Tae-Bong

IPC: G01B11/06 ,  G01B9/02

CPC classification number: G01B11/06 ,  G01B11/0675

Abstract: Provided are a transparent substrate monitoring apparatus and a transparent substrate monitoring method. The transparent substrate monitoring apparatus includes a light emitting unit emitting light; a double slit disposed on a plane defined in a first direction and a second direction intersecting a propagation direction of incident light and includes a first slit and a second slit spaced apart from each other in the first direction to allow the light to pass therethrough; an optical detection unit measuring an intensity profile or position of an interference pattern formed on a screen plane; and a signal processing unit receiving a signal from the optical detection unit to calculate an optical phase difference or an optical path difference.

Abstract translation: 提供透明基板监视装置和透明基板监视方法。 透明基板监视装置包括发光部的发光部; 设置在沿着与入射光的传播方向相交的第一方向和第二方向限定的平面上的双狭缝，并且包括在所述第一方向上彼此间隔开的第一狭缝和第二狭缝，以允许光通过; 光学检测单元，测量形成在屏幕平面上的干涉图案的强度分布或位置; 以及信号处理单元，接收来自光学检测单元的信号以计算光学相位差或光程差。