Patent search ap:("KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE") AND inv:"Jonghan Jin" Page 1

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发明授权
Absolute position measuring method, absolute position measuring apparatus, and colour scale comprising plural symbols each with plural segments of different color patterns 有权

公开(公告)号：US10801864B2

公开(公告)日：2020-10-13

申请号：US16242788

申请日：2019-01-08

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jong-Ahn Kim , Jae-Wan Kim , Jae-Yong Lee , Jonghan Jin , Jae-Heun Woo

IPC: G01D5/347

Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.

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