公开(公告)号：US10801864B2

公开(公告)日：2020-10-13

申请号：US16242788

申请日：2019-01-08

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Jae-Yong Lee ,  Jonghan Jin ,  Jae-Heun Woo

IPC: G01D5/347

Abstract: Provided is an absolute position color scale disposed to represent a binary code using a first symbol, having a first width and representing a first state (“HIGH”), and a second symbol having the first width and representing a second state (“LOW”). Each of the first and second symbols is divided into two or more segments having the same structure, and the first symbol has the same shape as the second symbol, but has a color pattern different from a color pattern of the symbol.

公开(公告)号：US11378665B2

公开(公告)日：2022-07-05

申请号：US16321210

申请日：2017-08-09

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jae-Wan Kim ,  Jae-Yong Lee ,  Jong-Ahn Kim ,  Jae-Heun Woo ,  Young Pyo Hong

IPC: G01S7/4865 ,  G06T7/70 ,  G01C11/06 ,  G06T7/55 ,  H04N5/232 ,  G01S17/10 ,  G01S17/89

Abstract: A distance measuring apparatus includes an image sensor and an image sensor driver. The image sensor includes a photodiode, a first capacitor and a second capacitor, and a first transfer gate and a second transfer gate configured to transmit an output of the photodiode to the respective first and second capacitors. The image sensor driver is configured to complementarily drive the first transfer gate and the second transfer gate.

公开(公告)号：US09921051B2

公开(公告)日：2018-03-20

申请号：US14323211

申请日：2014-07-03

Applicant: KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE

Inventor： Jae-Wan Kim ,  Jong-Ahn Kim ,  Chu-Shik Kang ,  Jong-Han Jin

IPC: G01B11/06 ,  G01B11/14 ,  G01B9/02 ,  G01N21/21 ,  G01S17/36 ,  G01N21/45

CPC classification number: G01B11/06 ,  G01B9/0201 ,  G01B9/02081 ,  G01B11/14 ,  G01N21/211 ,  G01N21/45 ,  G01N2021/213 ,  G01S17/36

Abstract: Provided are a thickness measuring apparatus and a thickness measuring method. The thickness measuring method includes irradiating a first laser beam of a first wavelength λ1 to a transparent substrate and measuring intensity of the first laser beam transmitting through the transparent substrate; irradiating a second laser beam of a second wavelength λ2 to the transparent substrate and measuring intensity of the second laser beam transmitting through the transparent substrate; and extracting a rotation angle on a Lissajous graph using the first and second laser beams transmitting through the transparent substrate. A phase difference between adjacent rays by multiple internal reflection of the first laser beam and a phase difference between adjacent rays by multiple internal reflection of the second laser beam is maintained at π/2.

公开(公告)号：US09927224B2

公开(公告)日：2018-03-27

申请号：US14988332

申请日：2016-01-05

Applicant: Korea Research Institute of Standards and Science

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Jae-Yong Lee ,  Jae-Heun Woo

IPC: G01B11/02 ,  G01B11/06 ,  G01B9/02 ,  H04N5/225 ,  H04N7/18

CPC classification number: G01B11/06 ,  G01B9/02041 ,  G01B11/0675 ,  H04N5/2254 ,  H04N5/2256 ,  H04N7/18

Abstract: A thickness measuring apparatus and a thickness measuring method. The thickness measuring apparatus includes a light source outputting an extended monochromatic light with coherence; a collimating lens converting output light of the light source into incident beam of parallel ray; a beam splitter reflecting and providing the incident beam to a measurement target and transmitting first reflection light reflected on a top surface of the measurement target and second reflection light reflected on a bottom surface of the measurement target; an imaging lens disposed between the measurement target and the beam splitter with a predetermined focal distance to receive and provide the incident beam to a measurement position of the measurement target disposed on the focal distance; a camera photographing an interference fringe formed by the first and second reflection lights and outputting an interference fringe image; and a processing part.

公开(公告)号：US09651403B2

公开(公告)日：2017-05-16

申请号：US14540743

申请日：2014-11-13

Applicant: Korea Research Institute of Standards and Science

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Tae-Bong Eom ,  Chu-Shik Kang ,  Jong-Han Jin

IPC: G01D5/347 ,  G01D5/245

CPC classification number: G01D5/34707 ,  G01D5/2455 ,  G01D5/34746 ,  G01D5/34776 ,  G01D5/34792

Abstract: Provided are an absolute position measurement method, an absolute position measurement apparatus, and a scale. The scale includes a scale pattern formed by replacing repeatedly arranged pseudo-random-codes with a sequence of a linear feedback shift register of N stages using a first symbol with first width representing a first state and a second symbol with second width representing a second state. The first is divided into two or more first symbol areas of different structures, and the second symbol is divided into two or more second symbol areas of different structures. There is at least one overlap area in which the first symbol and the second symbol overlap each other to have the same structure.

公开(公告)号：US20160202038A1

公开(公告)日：2016-07-14

申请号：US14988332

申请日：2016-01-05

Applicant: Korea Research Institute of Standards and Science

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Jae-Yong Lee ,  Jae-Heun Woo

IPC: G01B11/06 ,  G01B9/02 ,  G06T7/00 ,  H04N7/18 ,  H04N5/225

CPC classification number: G01B11/06 ,  G01B9/02041 ,  G01B11/0675 ,  H04N5/2254 ,  H04N5/2256 ,  H04N7/18

Abstract: A thickness measuring apparatus and a thickness measuring method. The thickness measuring apparatus includes a light source outputting an extended monochromatic light with coherence; a collimating lens converting output light of the light source into incident beam of parallel ray; a beam splitter reflecting and providing the incident beam to a measurement target and transmitting first reflection light reflected on a top surface of the measurement target and second reflection light reflected on a bottom surface of the measurement target; an imaging lens disposed between the measurement target and the beam splitter with a predetermined focal distance to receive and provide the incident beam to a measurement position of the measurement target disposed on the focal distance; a camera photographing an interference fringe formed by the first and second reflection lights and outputting an interference fringe image; and a processing part.

Abstract translation: 厚度测量装置和厚度测量方法。 厚度测量装置包括：输出具有相干性的扩展单色光的光源; 准直透镜将光源的输出光转换为入射光束的平行光线; 将入射光束反射并提供给测量对象并透射在测量对象的顶表面上反射的第一反射光和在测量对象的底表面上反射的第二反射光的分束器; 成像透镜，其设置在所述测量对象物和所述分束器之间，具有预定的焦距，以接收并将所述入射光束提供给设置在所述焦距上的所述测量对象的测量位置; 拍摄由第一和第二反射光形成的干涉条纹并输出干涉条纹图像的相机; 和处理部。

公开(公告)号：US20150069225A1

公开(公告)日：2015-03-12

申请号：US14540743

申请日：2014-11-13

Applicant: Korea Research Institute of Standards and Science

Inventor： Jong-Ahn Kim ,  Jae-Wan Kim ,  Tae-Bong Eom ,  Chu-Shik Kang ,  Jong-Han JIN

IPC: G01D5/347

CPC classification number: G01D5/34707 ,  G01D5/2455 ,  G01D5/34746 ,  G01D5/34776 ,  G01D5/34792

Abstract: Provided are an absolute position measurement method, an absolute position measurement apparatus, and a scale. The scale includes a scale pattern formed by replacing repeatedly arranged pseudo-random-codes with a sequence of a linear feedback shift register of N stages using a first symbol with first width representing a first state and a second symbol with second width representing a second state. The first is divided into two or more first symbol areas of different structures, and the second symbol is divided into two or more second symbol areas of different structures. There is at least one overlap area in which the first symbol and the second symbol overlap each other to have the same structure.

Abstract translation: 提供绝对位置测量方法，绝对位置测量装置和刻度。 标度包括通过使用具有表示第一状态的第一宽度的第一符号和代表第二状态的第二宽度的第二符号将具有N级的线性反馈移位寄存器的序列的重复排列的伪随机码替换的比例模式 。 第一符号区域分为两个或更多个不同结构的第一符号区域，第二符号被划分为两个或更多个不同结构的第二符号区域。 存在至少一个重叠区域，其中第一符号和第二符号彼此重叠以具有相同的结构。