公开(公告)号：US20160356647A1

公开(公告)日：2016-12-08

申请号：US14950598

申请日：2015-11-24

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White ,  Darren Schipper

IPC: G01J3/02 ,  G01J3/44

CPC classification number: G01J3/0297 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01N21/65

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US10260942B2

公开(公告)日：2019-04-16

申请号：US15588005

申请日：2017-05-05

Applicant: Kaiser Optical Systems, Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White

IPC: G01J3/02 ,  G01J3/44 ,  G01J3/28

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US20170241837A1

公开(公告)日：2017-08-24

申请号：US15588005

申请日：2017-05-05

Applicant: Kaiser Optical Systems, Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White

IPC: G01J3/02 ,  G01J3/44

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01J2003/2866

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US20160356646A1

公开(公告)日：2016-12-08

申请号：US14728818

申请日：2015-06-02

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White

IPC: G01J3/02 ,  G01J3/44

CPC classification number: G01J3/0286 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01J2003/2866

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

Abstract translation: 描述了用于光谱仪暗校正的方法和系统，其实现更稳定的基线，特别是对于强度校正放大任何非零零暗结果的边缘的边缘，以及由于相机窗框的温度变化引起的暗电流变化通常更多 发音。 由此导致的基线曲率使得这些区域难以定量化。 使用本发明可以提供用于识别系统故障状态的度量，例如相机真空密封的损失，温度稳定的漂移和光泄漏。 在本发明的系统方面，处理器从光谱仪中的光检测器接收信号，并执行软件程序以计算光谱响应，总和或平均结果，并执行执行所公开方法所需的其它操作。 在最优选的实施例中，从样品接收的光信号用于拉曼分析。

公开(公告)号：US20180328785A1

公开(公告)日：2018-11-15

申请号：US16043652

申请日：2018-07-24

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White ,  Darren Schipper

IPC: G01J3/02 ,  G01J3/44 ,  G01J3/28 ,  G01N21/65

CPC classification number: G01J3/0297 ,  G01J3/027 ,  G01J3/28 ,  G01J3/44 ,  G01N21/65

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the present disclosure may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the present disclosure, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US10048128B2

公开(公告)日：2018-08-14

申请号：US14950598

申请日：2015-11-24

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  James M. Tedesco ,  Joseph B. Slater ,  Francis Esmonde-White ,  Darren Schipper

IPC: G01J3/02 ,  G01J3/44 ,  G01J3/28 ,  G01N21/65

Abstract: Methods and systems for spectrometer dark correction are described which achieve more stable baselines, especially towards the edges where intensity correction magnifies any non-zero results of dark subtraction, and changes in dark current due to changes in temperature of the camera window frame are typically more pronounced. The resulting induced curvature of the baseline makes quantitation difficult in these regions. Use of the invention may provide metrics for the identification of system failure states such as loss of camera vacuum seal, drift in the temperature stabilization, and light leaks. In system aspects of the invention, a processor receives signals from a light detector in the spectrometer and executes software programs to calculate spectral responses, sum or average results, and perform other operations necessary to carry out the disclosed methods. In most preferred embodiments, the light signals received from a sample are used for Raman analysis.

公开(公告)号：US20150339262A1

公开(公告)日：2015-11-26

申请号：US14282780

申请日：2014-05-20

Applicant: Kaiser Optical Systems Inc.

Inventor： Patrick Wiegand ,  Ronald C. Fairchild

IPC: G06F17/10 ,  G01J3/44

CPC classification number: G06F17/10 ,  G01J3/28 ,  G01J3/44 ,  G06F17/18

Abstract: Raw data inputs are treated as independent signal sources to reduce computational lag without adversely affecting signal-to-noise ratio (SNR). Applications include spectroscopy, multiple linear regression, mass balance quantitation and the calculation of physical properties. The input-specific averaging has been applied to Raman spectroscopy, where the inputs are averaged spectra from which peak heights or areas are obtained from integration. Alternatively, peak areas or heights can be obtained from unaveraged spectra and are then averaged before use in further calculations as inputs to produce a desired output. The output(s) are linear or nonlinear combinations of the peak heights or areas, coupled with weighting factors which relate the raw inputs to a quantitative output such as concentration of a chemical species. Each specific input can use a different type of averaging. The overall goal may be optimization for best precision, and/or optimization for minimum lag time.

Abstract translation: 原始数据输入被视为独立信号源，以减少计算滞后，而不会不利地影响信噪比（SNR）。 应用包括光谱学，多元线性回归，质量平衡定量和物理性质的计算。 输入特异性平均已经应用于拉曼光谱，其中输入是从积分获得峰高或区域的平均光谱。 或者，可以从未平整光谱获得峰面积或高度，然后在进一步计算之前对其进行平均，作为输出以产生期望的输出。 输出是峰值高度或面积的线性或非线性组合，以及将原始输入与定量输出（例如化学物质的浓度）相关联的加权因子。 每个具体的输入可以使用不同类型的平均值。 总体目标可能是优化最佳精度，和/或优化最小滞后时间。