公开(公告)号：AT373193T

公开(公告)日：2007-09-15

申请号：AT00914757

申请日：2000-02-29

Applicant: LAM RES CORP

Inventor： KROEKER TONY ,  MOORING BENJAMIN ,  BRIGHT NICOLAS

IPC: F16K51/02 ,  F16K3/18 ,  H01L21/00 ,  H01L21/677

Abstract: A dual sided slot valve is in a vacuum body between adjacent process and transport modules. Separate valves are provided for each of two valve body slots, one body slot being separately closed or opened independently of the other. The separate valves allow a vacuum in the transport module while an adjacent process module is open to the atmosphere for servicing. The valve allows access to an open valve for servicing the open valve in that one actuator motor stops the valve in an open, but not vertically-spaced, position relative to the respective slot. The open valve is more easily reached by a gloved hand of a service worker. A separate actuator motor moves the valve vertically down from the open position and away from the slot to expose the sealing surface around the slot for cleaning. The vertical distance of the vertically-moved valve from an access opening makes it difficult for the worker's glove to reach the valve for service. However, in the vertically-moved position the valve does not interfere with the ability to clean around the valve door. The dual sided slot valves are offset relative to each other to reduce the distance occupied by the valve body between the adjacent transport and process modules.

公开(公告)号：SG11202102115YA

公开(公告)日：2021-04-29

申请号：SG11202102115Y

申请日：2019-09-09

Applicant: LAM RES CORP

Inventor： MOORING BENJAMIN ,  GENETTI DAMON

IPC: H01L21/68 ,  H01L21/66 ,  H01L21/67 ,  H01L21/677

Abstract: Each sensor in an array of sensors detects and signals when an edge of a wafer passes by the sensor on a wafer handling component of a robot. A number (N) of detected wafer edge locations is determined. Each detected wafer edge location is a set of coordinates (x, y) in a coordinate system of the wafer handling component. For each unique set of (N−1) of the number (N) of detected wafer edge locations, an estimated wafer offset is determined that substantially minimizes a performance index value. The estimated wafer offset is a vector extending from a center of the coordinate system of the wafer handling component to an estimated center location of the wafer. A final wafer offset is identified as the estimated wafer offset that has a smallest corresponding performance index value. The final wafer offset is used to center the wafer at a target station.