公开(公告)号：DE102004049770A1

公开(公告)日：2006-04-13

申请号：DE102004049770

申请日：2004-10-12

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER ,  BURGER GABRIELE

IPC: G02B21/00

Abstract: The device has a reflective and/or scattered light suppressing device (40) arranged in an optical path between selection and detection devices to suppress reflective and scattered light of an illuminating light of a scan microscope. The device (40) has a graded filter (41) that includes long pass filters with different characteristics. The long pass filters are replaceable and arranged one after another on a common substrate. An independent claim is also included for a scan microscope with a device for selecting and detecting spectral regions of light rays.