Raster microscope
    1.
    发明专利
    Raster microscope 有权
    RASTER MICROSCOPE

    公开(公告)号:JP2005055895A

    公开(公告)日:2005-03-03

    申请号:JP2004223880

    申请日:2004-07-30

    CPC classification number: G02B21/0076 G02B21/002 G02B21/0032 G02B21/008

    Abstract: PROBLEM TO BE SOLVED: To provide a detector which can be used in a desired optical test.
    SOLUTION: This raster microscope has a light source to illuminate an object under test, a detection beam path and a detector disposed in the beam path to detect the light emitted from the object, and is also provided with a light injector which can lead the light other than the emitted light into the above beam path and supply it to the detector.
    COPYRIGHT: (C)2005,JPO&NCIPI

    Abstract translation: 要解决的问题:提供可以在期望的光学测试中使用的检测器。 解决方案:该光栅显微镜具有照亮被测物体的光源,检测光束路径和设置在光束路径中的检测器,以检测从物体发射的光,并且还设置有能够 将除发射光之外的光引导到上述光束路径中并将其提供给检测器。 版权所有(C)2005,JPO&NCIPI

    OPTICAL DEVICE FOR SELECTING AND DETECTING SPECTRAL AREA OF LIGHT

    公开(公告)号:JP2002122787A

    公开(公告)日:2002-04-26

    申请号:JP2001234937

    申请日:2001-08-02

    Inventor: KNEBEL WERNER

    Abstract: PROBLEM TO BE SOLVED: To provide a device for densely scanning and detecting many narrow- band spectral areas from among spectral areas to be detected with variable adjusting steps. SOLUTION: As for the optical device which is provided with a means of performing the spectral resolution of light (1), a means (3) of selecting a prescribed spectral area (4) and a detector (5), and which is prepared for selecting and detecting the light (1) in the spectral area out of the light (1) for a confocal scanning microscope, the relative positions of the spectral-resolved light (19) and the detector (5) are moved freely, so as to work on the spectral areas (4 and 8) to be detected.

    CONFOCAL LASER SCANNING MICROSCOPE

    公开(公告)号:JP2001142002A

    公开(公告)日:2001-05-25

    申请号:JP2000310662

    申请日:2000-10-11

    Abstract: PROBLEM TO BE SOLVED: To provide a general type confocal laser scanning microscope constituted so that a light source which is inexpensively acquired and operated can be used for the purpose of CLSM. SOLUTION: This confocal laser scanning microscope having at least one detector 4 to detect detecting light 3 coming from at least one laser beam source 1 for irradiating a sample 2 is provided with additional light source 5 and 8 which are not single mode (TEM00) laser beam sources in order to extend the use of the CLSM while using the light source which is inexpensively acquired and operated.

    Method for examining structure labeled with by fluorogenic material of specimen at high spatial resolution
    4.
    发明专利
    Method for examining structure labeled with by fluorogenic material of specimen at high spatial resolution 审中-公开
    用高度空间分辨率的样品荧光材料标记结构的方法

    公开(公告)号:JP2008083047A

    公开(公告)日:2008-04-10

    申请号:JP2007243822

    申请日:2007-09-20

    CPC classification number: G01N33/542

    Abstract: PROBLEM TO BE SOLVED: To provide a method for examining a structure that is labeled, at high spatial resolution, by fluorogenic material of a specimen. SOLUTION: The method for examining the structure that is labeled, at a high spatial resolution, by a fluorogenic material of the specimen and that can repeatedly convert the fluorogenic material, from a first state into a second that are mutually different states regarding at least one optical characteristic includes a step of initially setting a substance to be detected within a specimen region in the first state; and a step of inducing the second state, in a manner of controlling small regions that are spatially divided by an optical signal within the specimen region. A ligand complex (1), containing the fluorogenic material, is bonded to an enzyme (4) through an enzyme reaction inside a cell; and based on the fact that the enzyme (4) is developed as a fusion protein (6), together with a target protein (5), the protein within the living cell i.e. the target protein (5) is defined by being used as a structure labeled by the fluorogenic material. COPYRIGHT: (C)2008,JPO&INPIT

    Abstract translation: 要解决的问题:提供一种用于检查以高空间分辨率由样品的荧光材料标记的结构的方法。 解决方案:用于检查以高空间分辨率由样品的荧光材料标记并且可以将荧光材料重复转换的第一状态的第二状态的结构的方法,所述第二状态是相互不同的状态 至少一个光学特性包括在第一状态下在样本区域内初始设定待检测物质的步骤; 以及以控制由样本区域内的光信号空间分割的小区域的方式诱导第二状态的步骤。 含有荧光物质的配体络合物(1)通过细胞内的酶反应与酶(4)结合; 并且基于酶(4)作为融合蛋白(6)与靶蛋白(5)一起发展的事实,活细胞内的蛋白质即靶蛋白(5)被定义为作为 由荧光材料标记的结构。 版权所有(C)2008,JPO&INPIT

    Method and device for detecting dark state in spectroscopic or microscopic inspection for fluorescent sample
    5.
    发明专利
    Method and device for detecting dark state in spectroscopic or microscopic inspection for fluorescent sample 有权
    用于检测荧光样品的光谱或微观检查中的深色状态的方法和装置

    公开(公告)号:JP2006234815A

    公开(公告)日:2006-09-07

    申请号:JP2006043884

    申请日:2006-02-21

    CPC classification number: G01N21/6428 G01N21/6408 G01N21/6458

    Abstract: PROBLEM TO BE SOLVED: To univocally or clearly discriminate between a phenomenon to be observed and a necessarily occurring dark state, in spectroscopic or microscopic inspection for a fluorescent sample.
    SOLUTION: This method is a detection method for a state in spectroscopic or microscopic inspection for a fluorescent processed samples, especially those having fluorescent colored protein (two or more). The method is characterized in that in at least two independent measurements, excitation/illumination volume of excited light, that is, distribution of intensity is changed; and when it is detected whether a time constant to be observed is changed, and if the time constant is not changed, the existence of dark state is concluded.
    COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:在荧光样品的光谱或显微镜检查中,要明确或清楚地区分待观察的现象和必然发生的暗态。 解决方案:该方法是用于荧光加工样品,特别是具有荧光着色蛋白质(两种或更多种)的荧光加工样品的光谱或显微镜检查状态的检测方法。 该方法的特征在于,在至少两次独立测量中,激发光的激发/照明体积,即强度分布发生变化; 并且当检测到是否改变要观察的时间常数时,如果时间常数不改变,则暗态的存在结束。 版权所有(C)2006,JPO&NCIPI

    METHOD FOR PRODUCING THREE-DIMENSIONAL OBJECT

    公开(公告)号:JP2002113786A

    公开(公告)日:2002-04-16

    申请号:JP2001163766

    申请日:2001-05-31

    Abstract: PROBLEM TO BE SOLVED: To provide a method for producing a three-dimensional object based on an original three-dimensional object by which the object can be produced (reproduced) with complete fidelity to a prototype in shape based on the original object through scanning the original object with high resolution and high fidelity. SOLUTION: The method for producing the three-dimensional object based on the original three-dimensional object in such a way that the original object is scanned with a light beam from a light source, the light reflected back from the original object is detected and the original object data are produced, is characterized in that the scanning optical system (7, 8 and 9) is confocally operated.

    Microscope
    7.
    发明专利
    Microscope 有权
    显微镜

    公开(公告)号:JP2006011440A

    公开(公告)日:2006-01-12

    申请号:JP2005182095

    申请日:2005-06-22

    CPC classification number: G02B21/16

    Abstract: PROBLEM TO BE SOLVED: To provide a microscope of the kind with which interference-free image acquisition is possible and negative impact on the detector is avoided, even in the presence of critical measurement parameters. SOLUTION: The microscope includes at least one illuminating light source, illumination beam path for guiding the illuminating light to a specimen, a detector, and a detection beam path for guiding detected light from the specimen to the detector. In such a microscope, in particular a fluorescence microscope, an activatable element is positioned in the detection beam path (3) for regulating and/or limiting power level in the detection beam path (3). COPYRIGHT: (C)2006,JPO&NCIPI

    Abstract translation: 要解决的问题:即使在存在关键测量参数的情况下,提供可以避免无干扰图像获取的类型的显微镜并避免对检测器的负面影响。 解决方案:显微镜包括至少一个照明光源,用于将照射光引导到样本的照明光束路径,检测器和用于将检测到的光从样本引导到检测器的检测光束路径。 在这种显微镜中,特别是荧光显微镜,可检测光束路径(3)中的可激活元件位于检测光束路径(3)中用于调节和/或限制功率电平。 版权所有(C)2006,JPO&NCIPI

    Method for scanning region of interest(roi) by high time resolution
    8.
    发明专利
    Method for scanning region of interest(roi) by high time resolution 审中-公开
    用于通过高分辨率扫描兴趣区域(ROI)的方法

    公开(公告)号:JP2003043371A

    公开(公告)日:2003-02-13

    申请号:JP2002161432

    申请日:2002-06-03

    CPC classification number: G02B21/0084 G02B21/0032

    Abstract: PROBLEM TO BE SOLVED: To provide a method of scanning concern regions of interest(ROIs) of a sample with high temporal resolution.
    SOLUTION: The laser beams from light sources 1 and 2 pass an acousto- optic turnable filter(AOTF) 5, capable of selecting the intensity of the light beams and irradiates the sample 11 by a scanner 9 and an objective lens 10. The fluorescence generated by the sample 11 arrives at a detector 12 through the objective lens 10 and the scanner 9. The irradiation intensity levels of a plural of the concern regions (ROI) and a background exclusive of the same are made changeable respectively under different conditions, by using device constituted thus.
    COPYRIGHT: (C)2003,JPO

    Abstract translation: 要解决的问题:提供以高时间分辨率扫描样本的关注区域(ROI)的方法。 解决方案:来自光源1和2的激光束通过声光可转换滤光片(AOTF)5,能够选择光束的强度并通过扫描仪9和物镜10照射样品11.产生荧光 通过样品11通过物镜10和扫描仪9到达检测器12.多个关注区域(ROI)的照射强度水平和不同背景的背景在不同条件下分别通过使用 装置构成。

    METHOD AND DEVICE FOR CONTROLLING BEAM IN SCANNING MICROSCOPE

    公开(公告)号:JP2002196249A

    公开(公告)日:2002-07-12

    申请号:JP2001310089

    申请日:2001-10-05

    Abstract: PROBLEM TO BE SOLVED: To disclose a method and a device for controlling a beam in a scanning microscope with which individual areas or interested areas scattered over a whole focused area are scanned. SOLUTION: The scanning microscope is provided with a means (3) for acquiring and displaying preview images (7) and a microscope optical system (51). A means for displaying at least one interested area (27, 29) among preview images (7). A first beam deflection device (43, 67 and 78) moves the scanning area (31, 33) to the interested area (27, 29), and a second beam deflection device (49, 72 and 94) works as scanning in a form of bent pattern in the scanning area (31, 33).

    Scanning microscope and method for imaging object with optical microscope
    10.
    发明专利
    Scanning microscope and method for imaging object with optical microscope 有权
    扫描显微镜和用光学显微镜成像对象的方法

    公开(公告)号:JP2013003585A

    公开(公告)日:2013-01-07

    申请号:JP2012133714

    申请日:2012-06-13

    Abstract: PROBLEM TO BE SOLVED: To improve a scanning microscope so that an optical microscope is able to perform imaging free from collision even in a difficult geometric condition.SOLUTION: In order to incline each illuminating focus (16, 84) with respect to the optical axis (O) of an illuminating optical system (10), a scanner (33) directs an illuminating light beam (12) to a partial area away from the pupil center of the incident pupil (14) of the illuminating optical system (10). Also, in order to move the illuminating focus (16, 84) over an illuminating target area, the scanner changes the direction of incidence of the illuminating light beam (12) within the partial area. An observation objective lens (38) spatially separated from the illuminating optical system (10) is provided. The observation objective lens (38) is arranged so that its optical axis (O) is located substantially perpendicular to the illuminating target area and so that this axis forms an acute angle (α) with respect to the optical axis (O) of the illuminating optical system (10).

    Abstract translation: 要解决的问题:为了改善扫描显微镜,使得光学显微镜即使在困难的几何条件下也能够进行没有碰撞的成像。 解决方案:为了相对于照明光学系统(10)的光轴(O 1 )倾斜每个照明聚焦(16,84),扫描仪 (33)将照明光束(12)引导到远离照明光学系统(10)的入射光瞳(14)的光瞳中心的部分区域。 此外,为了将照明聚焦(16,84)移动到照明目标区域上,扫描器改变部分区域内的照明光束(12)的入射方向。 提供了与照明光学系统(10)在空间上分离的观察物镜(38)。 观察物镜38设置为使其光轴(O 3 )基本上垂直于照明目标区域,并且使得该轴形成锐角(α )相对于照明光学系统(10)的光轴(O 1 )。 版权所有(C)2013,JPO&INPIT

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