1.
    发明专利
    未知

    公开(公告)号:DE50104078D1

    公开(公告)日:2004-11-18

    申请号:DE50104078

    申请日:2001-06-19

    Inventor: ENGELHARDT DR

    Abstract: A holder defines the required position (5a) of the objective lens. During change over of the objective (5), it can be moved near the holder (26) with its longitudinal axis (6) essentially coaxial with the optical axis.

    2.
    发明专利
    未知

    公开(公告)号:DE50108931D1

    公开(公告)日:2006-04-20

    申请号:DE50108931

    申请日:2001-07-06

    Inventor: ENGELHARDT DR

    Abstract: The present invention relates to an optical arrangement for deflecting a light beam (1, 14), in particular in two substantially mutually perpendicular directions (2, 3), preferably for applying to confocal scanning microscopes, having two mirrors (8, 10) which can be rotated by means of a rotary drive (4, 5) in each case about mutually perpendicular axes-the x-axis (6) and y-axis (7)-one of the two mirrors (8, 10) being assigned a further mirror (9) in a prescribed angular position in a rotationally fixed fashion such that the mutually assigned mirrors (8, 9)-first and second mirrors-rotate jointly about the y-axis (7), and in so doing rotate the light beam (1, 14) about a pivot (11) which lies on the axis of rotation (6)-the x-axis-of the third mirror (10). In order to minimize and, in the ideal case, to eliminate the distortion errors produced by the arrangement, the optical arrangement is characterized in that the mirrors (8, 9, 10) are arranged in such a way that the optical axis of the light beam (12) running between the second and the third mirrors (9, 10) always lies substantially in a plane containing the x-axis (6) and perpendicular to the y-axis (7).

    4.
    发明专利
    未知

    公开(公告)号:DE50205325D1

    公开(公告)日:2006-01-26

    申请号:DE50205325

    申请日:2002-06-28

    Abstract: A scanning microscope examines a specimen (31). An optical component (89) has a characteristic that depends on wavelengths. A device uses wavelengths to perform detection that picks up measurement values in two wavelength ranges each characterized by spectral width and position. An Independent claim is also included for a method for using wavelengths to detect light emitted from a specimen by means of a scanning microscope.

    6.
    发明专利
    未知

    公开(公告)号:DE50108370D1

    公开(公告)日:2006-01-19

    申请号:DE50108370

    申请日:2001-06-08

    Abstract: The arrangement for studying microscopic preparations with a scanning microscope consists of a laser (1) and an objective (12), which focuses the light produced by the laser (1) onto a sample (13) to be studied, an optical waveguide element (3), which transports the light produced by the laser (1), being provided between the laser (1) and the objective (12). The optical waveguide element is constructed from a plurality of micro-optical structure elements which have at least two different optical densities. It is particularly advantageous if the optical waveguide element (3) consists of photonic band gap material and is configured as an optical fiber.

    8.
    发明专利
    未知

    公开(公告)号:DE50108075D1

    公开(公告)日:2005-12-22

    申请号:DE50108075

    申请日:2001-09-13

    Abstract: An arrangement for visual and quantitative three-dimensional examination of specimens, having a stereomicroscope (2). The stereomicroscope defines a first and a second observation beam path (4, 5), by way of which a specimen (6) to be examined can be visually observed. A confocal scanning device (1) is connected to the stereomicroscope (1) in such a way that a scanning beam path (3) defined by the confocal scanning device (1) scans the specimen (6) that is to be examined and in that context acquires data for a three-dimensional visual depiction of the specimen (6).

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