1.
    发明专利
    未知

    公开(公告)号:DE50203658D1

    公开(公告)日:2005-08-25

    申请号:DE50203658

    申请日:2002-05-24

    Abstract: Device for determination of the light intensity of a light beam (7) has a beam splitter (1) and a detector (11). The beam splitter divides off a measurement beam (23) from the incident beam and the ratio of the intensity of the light in the incident beam to that of the measurement beam is measured using the detector to ensure that the ratio remains constant. Beam splitter and detector form a single unit. Independent claims are also made for: (1) A microscope; (2) A microscopy method in which the intensity of the incident illumination beam is monitored.

    2.
    发明专利
    未知

    公开(公告)号:DE50108370D1

    公开(公告)日:2006-01-19

    申请号:DE50108370

    申请日:2001-06-08

    Abstract: The arrangement for studying microscopic preparations with a scanning microscope consists of a laser (1) and an objective (12), which focuses the light produced by the laser (1) onto a sample (13) to be studied, an optical waveguide element (3), which transports the light produced by the laser (1), being provided between the laser (1) and the objective (12). The optical waveguide element is constructed from a plurality of micro-optical structure elements which have at least two different optical densities. It is particularly advantageous if the optical waveguide element (3) consists of photonic band gap material and is configured as an optical fiber.

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