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1.发明专利Method and apparatus for identifying and correcting spherical aberration in microscope imaging beam path 有权用于识别和校正微观成像光束路径中的球状脱落的方法和装置
公开(公告)号：JP2013088809A
公开(公告)日：2013-05-13
申请号：JP2012224044
申请日：2012-10-09
Inventor： KNEBEL WERNER , TOBIAS BAUER , EUTENEUER PETER
CPC classification number: G01M11/02 , G02B21/241
Abstract: PROBLEM TO BE SOLVED: To provide a method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path.SOLUTION: There is provided a method for identifying a spherical error of a microscope imaging beam path (7) in a context of microscopic imaging of a sample (9) using a microscope (1) having an objective (10) and a coverslip (2) which carries or covers the sample (9) placed in the imaging beam path. A measurement beam (130) is guided in decentered fashion, outside an optical axis (8) of the objective (10), through the objective (10) onto the sample (9). A measurement beam (132) reflected at an interface (116) between the sample (9) and the coverslip is guided through the objective (10) onto a detector (128). The detector (128) acquires an intensity profile of the reflected measurement beam (132), and the presence of a spherical error is determined qualitatively and/or quantitatively from the intensity profile.
Abstract translation: 要解决的问题：提供一种用于在显微镜成像光束路径中识别和校正球面像差的方法和装置。 解决方案：提供了一种用于在使用具有物镜（10）和（10）的显微镜（1）的样品（9）的显微镜成像的上下文中识别显微镜成像光束路径（7）的球面误差的方法， 盖玻片（2），其承载或覆盖放置在成像光束路径中的样品（9）。 测量光束（130）以偏心方式被引导到物镜（10）的光轴（8）外部，通过物镜（10）被引导到样品（9）上。 在样品（9）和盖玻片之间的界面（116）处反射的测量光束（132）被引导到物镜（10）到检测器（128）上。 检测器（128）获取反射的测量光束（132）的强度分布，并且根据强度分布确定和/或定量地确定球面误差的存在。 版权所有（C）2013，JPO＆INPIT
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公开(公告)号：JP2004212995A
公开(公告)日：2004-07-29
申请号：JP2003430170
申请日：2003-12-25
Inventor： HUND ANDREAS , HERMANNS KLAUS , EUTENEUER PETER
CPC classification number: G02B21/248 , G02B21/361
Abstract: PROBLEM TO BE SOLVED: To provide a tube to be adapted to a microscope having an adaptable interface (2), an operator interface (3) arranged to be rotated, a beam refracting device (4) and a beam refracting unit (5) arranged to be rotated.
SOLUTION: As for the tube, a light beam coming from the adaptable interface (2) is refracted toward the beam refracting unit (5) arranged to be rotated by using the beam refracting device (4), and the rotation of the operator interface (3) is forcibly coupled with the rotation of the unit (5) arranged to be rotated. In the tube, the device (4) is equipped with a beam splitting assembly (6) in order to utilize a documentation interface (11).
COPYRIGHT: (C)2004,JPO&NCIPI-
公开(公告)号：JP2004185005A
公开(公告)日：2004-07-02
申请号：JP2003402134
申请日：2003-12-01
Inventor： KRUEGER RALF , EUTENEUER PETER
CPC classification number: G02B21/12 , G02B21/086
Abstract: PROBLEM TO BE SOLVED: To provide a simple microscope illumination unit which ensures proper visual field and pupil illumination, in a standard range (10× to 100×), a scan range (1.6× to 5×), and a macrorange (1× to 1.6×).
SOLUTION: The transmitted light illuminator of the microscope has the scheme, in which an illumination light from a light source prescribes the illumination optical axis, and is incident on the surface of a sample via a contact lens, a stop for field vision, and an aperture diaphragm. The transmissive illuminator includes a single condenser lens 5, which is constituted so as to be capable of being inserted/removed and a focusing lens 8, which is disposed between the field stop 4 and the aperture diaphragm 3 and which can slide along the illumination optical axis.
COPYRIGHT: (C)2004,JPO&NCIPIAbstract translation: 要解决的问题：为了提供一个简单的显微镜照明单元，其在标准范围（10×100×），扫描范围（1.6×5×）和宏观范围内确保适当的视场和瞳孔照明 （1×〜1.6×）。
解决方案：显微镜的透射光照明器具有这样的方案，其中来自光源的照明光规定照明光轴，并且经由隐形眼镜入射到样品的表面上，用于野外视野的停止 ，和孔径光阑。 透射式照明器包括单个聚光透镜5，该聚光透镜5被构造成能够被插入/移除;以及聚焦透镜8，其设置在场光阑4和孔径光阑3之间，并且可以沿照明光学 轴。 版权所有（C）2004，JPO＆NCIPI
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公开(公告)号：JP2012048242A
公开(公告)日：2012-03-08
申请号：JP2011184658
申请日：2011-08-26
Inventor： EUTENEUER PETER , KRUEGER RALF
IPC: G02B21/12
CPC classification number: G02B21/02 , G02B21/06 , G02B21/08 , G02B21/248 , G02B27/28
Abstract: PROBLEM TO BE SOLVED: To provide a microscope including a macro and a micro objective.SOLUTION: The microscope includes an objective turret 14 which holds at least one micro objective 15 and a macro objective 5 comprising a plurality of optical subsystems 5a, 5b, and incident illumination device 20 which can be inserted into an imaging beam path 29 between the objective lens turret 14 and an observation optical device 9, and includes a beam splitter 12 for coupling an illumination beam path 28 to the imaging beam path 29. The incidence illumination device 20 includes an adjustment optical device 2 which is inserted when the macro objective 5 is rotated to its operation position, and has positive refracting power, and the adjustment optical device 2 shifts an illumination pupil to that for the macro objective 5 to light up an objective 6 telecentrically through both the micro objective lens 15 and the macro objective 5 as the alternative.
Abstract translation: 要解决的问题：提供包括宏观和微观物镜的显微镜。
解决方案：显微镜包括一个目标转塔14，其保持至少一个微物镜15和一个宏观物镜5，宏观物镜5包括多个光学子系统5a，5b和入射照明装置20，入射照明装置20可插入成像光束路径29 在物镜转台14和观察光学装置9之间，包括用于将照明光束路径28耦合到成像光束路径29的分束器12.入射照明装置20包括调整光学装置2，其在宏 物镜5旋转到其操作位置并具有正的折射力，并且调节光学装置2将照明光瞳移动到宏观物镜5的照明光瞳，以通过微物镜15和宏观物镜两者以中心方式照亮物镜6 5作为替代。 版权所有（C）2012，JPO＆INPIT
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公开(公告)号：JP2006235629A
公开(公告)日：2006-09-07
申请号：JP2006043887
申请日：2006-02-21
Inventor： STORZ RAFAEL , BIRK HOLGER , ULRICH HEINRICH , EUTENEUER PETER
CPC classification number: G02B21/0036
Abstract: PROBLEM TO BE SOLVED: To constitute a scanning microscope so that, above all, it can be adjusted very easily.
SOLUTION: The scanning microscope or a raster microscope has a system, provided with a scan head (2) having a scanner (1) for a light beam and a scanning barrel lens (3), where the scanning barrel lens (3) is coupled to the scanning head (2).
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题：为了构成扫描显微镜，首先它可以非常容易地调节。 解决方案：扫描显微镜或光栅显微镜具有系统，其具有扫描头（2），扫描头（2）具有用于光束的扫描仪（1）和扫描镜筒（3），其中扫描筒镜 ）耦合到扫描头（2）。 版权所有（C）2006，JPO＆NCIPI
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Patent Agency Ranking
公开(公告)号：JP2004213022A
公开(公告)日：2004-07-29
申请号：JP2004001174
申请日：2004-01-06
Inventor： HUND ANDREAS , PAUSCH ARMIN , EUTENEUER PETER
CPC classification number: G02B7/24 , G02B21/24 , G02B23/16 , G02B25/001
Abstract: PROBLEM TO BE SOLVED: To provide and develop a tube of such a kind that the interval from the operator of a microscope to the microscope can be changed in a specified direction while an observing angle is maintained.
SOLUTION: The tube to be adapted to the microscope has a tube housing (3), an adaptable interface (4), a beam diffracting unit (5), a further beam guiding means (7) and an operator interface (8). A light beam coming from the interface (4) is refracted by the unit (5) so that its optical axis (6) is at least locally extended on a specified surface substantially, and guided to the interface (8) by the guiding means (7). The housing (3) is constituted to move relatively in a direction parallel with a specified surface with respect to the microscope (2) together with the guiding means (7) and the interface (8) in order to maintain the observing angle, while the interval from the interface (8) to the microscope is changed in the specified direction.
COPYRIGHT: (C)2004,JPO&NCIPI-
公开(公告)号：WO2005078504A2
公开(公告)日：2005-08-25
申请号：PCT/EP2005050288
申请日：2005-01-24
Applicant: LEICA MICROSYSTEMS , EUTENEUER PETER , HERMANNS KLAUS
Inventor： EUTENEUER PETER , HERMANNS KLAUS
Abstract: The invention relates to an ergonomic tube (30) for a microscope (1). A binocular head (20) is provided on the tube (30). A deflection element (15) is provided in the tube (30) and a deflection mirror (18) is assigned to said element, the mirror (18) being located behind the optical path (5) of the lens, when viewed from the user's (17) position. A single tube-lens system (11) is positioned in the optical path (16) of the tube. A modification to the inclination of the ocular optical path (21) in relation to the horizontal (H) by a value alpha causes the position of the deflection mirror (18) to be modified by an angle alpha /2.
Abstract translation: 它是（1）中公开的显微镜更符合人体工程学管（30）。 在管（30）双目（20）设置。 在管（30）是设置与所述偏转反射镜（18）相关联的偏转元件，其特征在于，从所述透镜提供光束（5）的路径后面看到的位置（17）的用户的偏转反射镜（18）。 在管的光路（16）被布置在单个管透镜（11），并经阿尔法值的Okularstrahlengangs（21）相对于水平方向（H）的倾斜度的变化，偏转反射镜（18）处于其布置成一角度的α/ 2个不同的 定位。
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公开(公告)号：AT206531T
公开(公告)日：2001-10-15
申请号：AT95908186
申请日：1995-02-08
Applicant: LEICA MICROSYSTEMS
Inventor： KRUEGER ROLF , STANKEWITZ HANS-WERNER , GEHRMANN UTE , EUTENEUER PETER
Abstract: PCT No. PCT/DE95/00160 Sec. 371 Date Oct. 6, 1995 Sec. 102(e) Date Oct. 6, 1995 PCT Filed Feb. 8, 1995 PCT Pub. No. WO95/22072 PCT Pub. Date Aug. 17, 1995An exchangeable condenser system for a phase-contrast illuminating system (12) for microscopes has a plurality of different light rings (5), arranged on a nosepiece plate (4), assigned to the condenser optical system (6). The condenser optical system (6) can be exchanged independently of the light rings (5), the focal lengths Fn of the exchangeable condenser optical systems (6) being selected relative to one another in the ratio Fn=F0*Xn and the average diameters Dn of the light rings (5) being selected relative to one another in the ratio Dn=D0*Xn, where X>0, n=0,1,2,3, . . . .
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公开(公告)号：DE102011084562A1
公开(公告)日：2013-04-18
申请号：DE102011084562
申请日：2011-10-14
Applicant: LEICA MICROSYSTEMS
Inventor： KNEBEL WERNER DR , BAUER TOBIAS , EUTENEUER PETER
IPC: G02B21/00
Abstract: Die vorliegende Erfindung betrifft ein Verfahren zur Feststellung eines sphärischen Fehlers eines Mikroskop-Abbildungsstrahlengangs (7) bei einer mikroskopischen Abbildung einer Probe (9) mittels eines ein Objektiv (10) aufweisenden Mikroskops (1), wobei ein die Probe (9) tragendes oder bedeckendes Deckglas (2) im Abbildungsstrahlengang angeordnet ist, wobei ein Messstrahl (130) dezentriert außerhalb der optischen Achse (8) des Objektivs (10) durch das Objektiv (10) auf die Probe (9) und der an der Grenzfläche (116) des Deckglases zur Probe (9) reflektierte Messstrahl (132) über das Objektiv (10) auf einen Detektor (128) geleitet wird, der das Intensitätsprofil des reflektierten Messstrahls (132) aufnimmt, und wobei aus diesem Intensitätsprofil das Vorliegen eines sphärischen Fehlers qualitativ und/oder quantitativ bestimmt wird.
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公开(公告)号：DE102010039950A1
公开(公告)日：2012-03-01
申请号：DE102010039950
申请日：2010-08-30
Applicant: LEICA MICROSYSTEMS
Inventor： EUTENEUER PETER , KRUEGER RALF
IPC: G02B21/00
Abstract: Die vorliegende Erfindung betrifft ein Mikroskop (18) mit einem Objektivrevolver (14) zur Befestigung von mindestens einem Mikro-Objektiv (15), das in eine Arbeitsstellung auf eine optischen Achse (3) einschwenkbar ist, mit einer Beobachtungsoptik (9) in einem Abbildungsstrahlengang (29) und mit einem Makro-Objektiv (5) bestehend aus mehreren optischen Teilsystemen (5a, 5b), wobei ein erstes optisches Teilsystem (5a) am Objektivrevolver (14) befestigbar ist und ein zweites optisches Teilsystem (5b) zwischen dem Objektivrevolver (14) und der Beobachtungsoptik (9) in den Abbildungsstrahlengang (29) einfügbar ist, wobei eine einen telezentrischen Beleuchtungsstrahlengang (28) erzeugende Auflichtbeleuchtungseinrichtung (20) mit einem Strahlteiler (12) zur Einkopplung des Beleuchtungsstrahlengangs (28) in den Abbildungsstrahlengang (29) vorgesehen ist, mit der sowohl durch ein in seiner Arbeitsstellung befindliches Mikro-Objektiv (15) als auch alternativ durch das in seiner Arbeitsstellung befindliche erste optische Teilsystem (5a) des Makro-Objektivs (5) jeweils ein Beleuchtungsstrahlengang (28) mit einer objektivseitigen Beleuchtungspupille (26) erzeugbar ist, und wobei bei dem in seiner Arbeitsstellung befindlichen Makro-Objektiv (5) eine Anpassungsoptik (2) positiver Brechkraft in den Beleuchtungsstrahlengang (28) einbringbar ist, welche die Beleuchtungspupille (26) an die hintere Austrittspupille (27) des Makro-Objektivs (5) verlagert, die zwischen dem ersten optischen Teilsystem (5a) und dem Strahlteiler (12) liegt.
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