公开(公告)号：DE102007048089A1

公开(公告)日：2009-04-09

申请号：DE102007048089

申请日：2007-10-05

Applicant: LEICA MICROSYSTEMS

Inventor： SENDROWSKI PETER ,  KRESS CLAUS

IPC: G02B21/00

Abstract: A confocal scanning microscope for examining microscopic and macroscopic objects is described. The microscope comprises: a scanning optical system having optical elements imaging the light generated by a laser onto an object to be examined; an objective provided in a working distance of at least 0.4 inches from an object holder; and a zoom optical system that is connected to the scanning optical system such that the light generated by the laser passes first through the scanning optical system, then through the zoom optical system, and is then imaged through the objective onto the object. This microscope achieves that also macroscopic objects can be viewed at a high resolution.