公开(公告)号：JP2010181886A

公开(公告)日：2010-08-19

申请号：JP2010030333

申请日：2010-02-15

Applicant: Leica Microsystems Cms Gmbh ,  ライカ マイクロシステムズ ツェーエムエス ゲーエムベーハー

Inventor： KNEBEL WERNER ,  WAWROWSKY KOLJA

IPC: G02B21/00 ,  G02B21/06 ,  G02B26/10

CPC classification number: G02B21/0084 ,  G02B21/0032

Abstract: PROBLEM TO BE SOLVED: To provide a simple method for fundamentally improving temporal resolution and changing illumination conditions relating to a specimen. SOLUTION: In the method for scanning the specimen, by using illumination light beams emitted from at least one light source, a scanning process, wherein first scanning lines 21 are generated by scanning a desired portion of the specimen with illumination light beams of a first illumination condition, and then second scanning lines 22 are generated by scanning the desired portion with illumination light beams of a second illumination condition, is repeated several times, while changing the desired portion, and a first display 20a is acquired, based on a plurality of acquired first scanning lines 21, while a second display 20b is acquired based on a plurality of second scanning lines 22. COPYRIGHT: (C)2010,JPO&INPIT

Abstract translation: 要解决的问题：提供一种从根本上改善与样本有关的时间分辨率和改变照明条件的简单方法。 解决方案：在用于扫描样本的方法中，通过使用从至少一个光源发射的照明光束，扫描过程，其中通过用照射光束扫描样本的期望部分来产生第一扫描线21， 第一照明条件，然后通过用第二照明条件的照明光束扫描所需部分来产生第二扫描线22，在改变期望部分的同时重复多次，并且基于 多个获取的第一扫描线21，而基于多个第二扫描线22获取第二显示器20b。（C）2010年，JPO和INPIT

公开(公告)号：JP2003043371A

公开(公告)日：2003-02-13

申请号：JP2002161432

申请日：2002-06-03

Applicant: Leica Microsystems Heidelberg Gmbh ,  ライカ マイクロシステムズ ハイデルベルク ゲーエムベーハー

Inventor： KNEBEL WERNER ,  WAWROWSKY KOLJA

IPC: G02B21/06 ,  G02B21/00

CPC classification number: G02B21/0084 ,  G02B21/0032

Abstract: PROBLEM TO BE SOLVED: To provide a method of scanning concern regions of interest(ROIs) of a sample with high temporal resolution.
SOLUTION: The laser beams from light sources 1 and 2 pass an acousto- optic turnable filter(AOTF) 5, capable of selecting the intensity of the light beams and irradiates the sample 11 by a scanner 9 and an objective lens 10. The fluorescence generated by the sample 11 arrives at a detector 12 through the objective lens 10 and the scanner 9. The irradiation intensity levels of a plural of the concern regions (ROI) and a background exclusive of the same are made changeable respectively under different conditions, by using device constituted thus.
COPYRIGHT: (C)2003,JPO

Abstract translation: 要解决的问题：提供以高时间分辨率扫描样本的关注区域（ROI）的方法。 解决方案：来自光源1和2的激光束通过声光可转换滤光片（AOTF）5，能够选择光束的强度并通过扫描仪9和物镜10照射样品11.产生荧光 通过样品11通过物镜10和扫描仪9到达检测器12.多个关注区域（ROI）的照射强度水平和不同背景的背景在不同条件下分别通过使用 装置构成。

公开(公告)号：DE60205064D1

公开(公告)日：2005-08-25

申请号：DE60205064

申请日：2002-05-16

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER ,  WAWROWSKY KOLJA

IPC: G02B21/06 ,  G02B21/00

Abstract: The present invention concerns a method and an apparatus for for ROI-scan with high temporal resolution of a specimen (11).At least one light source (1, 2) generats an illumination light beam (4) to be scanned by a scanning device (9) across the specimen (11). The scan pattern (23) and at least one region of interest defines a first plurality of first scan lines (21) and a second plurality of second scan lines (22).Means for adjusting illumination conditions of the at least one light source are positioned in the illumination beam path prior to the scan device (9).Control means connected to the scan device (9) and the means for adjusting the illumination conditions are responsive to the position of the light beam on the specimen.

公开(公告)号：DE60205064T2

公开(公告)日：2006-06-01

申请号：DE60205064

申请日：2002-05-16

Applicant: LEICA MICROSYSTEMS

Inventor： KNEBEL WERNER ,  WAWROWSKY KOLJA

IPC: G02B21/00 ,  G02B21/06

Abstract: The present invention concerns a method and an apparatus for for ROI-scan with high temporal resolution of a specimen (11).At least one light source (1, 2) generats an illumination light beam (4) to be scanned by a scanning device (9) across the specimen (11). The scan pattern (23) and at least one region of interest defines a first plurality of first scan lines (21) and a second plurality of second scan lines (22).Means for adjusting illumination conditions of the at least one light source are positioned in the illumination beam path prior to the scan device (9).Control means connected to the scan device (9) and the means for adjusting the illumination conditions are responsive to the position of the light beam on the specimen.