-
公开(公告)号：JP2013033044A
公开(公告)日：2013-02-14
申请号：JP2012169469
申请日：2012-07-31
Inventor： WIDZGOWSKI BERND
IPC: G01J11/00
CPC classification number: G01J1/44
Abstract: PROBLEM TO BE SOLVED: To provide a device for photon counting and a method for the same.SOLUTION: A device for photon counting 10 comprises a detector unit 12, a switching unit 30, a sampling unit, a series-parallel conversion unit and an evaluation unit. The switching unit receives a collision by a detection signal 26 generated by the detector unit, and the sampling unit samples a state signal 32 generated by the switching unit and generates series sampling data. The series-parallel conversion unit groups the sampling data into sampling data packets. The evaluation unit operates at predetermined operation cycle time falling below a sampling frequency, and executes the steps of: evaluating at least one n-bit binary value in each of the sampling data packets within each clock cycle determined by the operation cycle time; identifying a partial counter counting result; adding the partial counter counting result identified within the individual clock cycle; and obtaining an overall counter counting result showing the number of detected photons.
Abstract translation: 要解决的问题：提供一种用于光子计数的装置及其方法。 解决方案：用于光子计数的装置10包括检测器单元12，开关单元30，采样单元，串并联转换单元和评估单元。 开关单元通过由检测器单元产生的检测信号26接收到冲突，并且采样单元对由开关单元生成的状态信号32进行采样并产生串联采样数据。 串并行转换单元将采样数据分组为采样数据分组。 评估单元在低于采样频率的预定操作周期时间运行，并且执行以下步骤：评估由所述操作周期时间确定的每个时钟周期内的每个采样数据分组中的至少一个n位二进制值; 识别部分计数器计数结果; 添加在各个时钟周期内识别的部分计数器计数结果; 并获得显示检测到的光子数量的总计数器计数结果。 版权所有（C）2013，JPO＆INPIT
-
公开(公告)号：JP2013040940A
公开(公告)日：2013-02-28
申请号：JP2012180131
申请日：2012-08-15
Inventor： SCHREIBER FRANK , WIDZGOWSKI BERND , BIRK HOLGER
CPC classification number: H01L31/024 , H01J40/02 , H01J40/16 , H01J43/02 , H01J43/28
Abstract: PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is embodied so as to receive light and generate an electric signal, and has a housing, a sensor arranged in the housing and a cooling element arranged in the housing. The cooling element electrically insulates the detector from the housing, or the cooling element is configured to be a part of an insulation body that electrically insulates the detector from the housing.
Abstract translation: 要解决的问题：提供一种检测装置。 解决方案：检测装置被实施为接收光并产生电信号，并且具有壳体，布置在壳体中的传感器和布置在壳体中的冷却元件。 冷却元件将检测器与壳体电绝缘，或者冷却元件构造成绝缘体的一部分，该绝缘体将检测器与壳体电绝缘。 版权所有（C）2013，JPO＆INPIT
-
公开(公告)号：JP2013117529A
公开(公告)日：2013-06-13
申请号：JP2012252081
申请日：2012-11-16
Inventor： WIDZGOWSKI BERND
CPC classification number: G01J1/44 , G01N21/6408 , G01N21/6458 , G02B21/0076 , G02B21/0084
Abstract: PROBLEM TO BE SOLVED: To provide a method and an apparatus for inspecting a sample.SOLUTION: Disclosed is a method and an apparatus for inspecting a sample. The apparatus includes: a light source for generating excitation rays of light with a pulse to be continuously generated with an excitation pulse frequency for illuminating a sample area with the excitation pulse; and a detector for detecting detection rays of light to be emitted from the sample area. In the apparatus, the detector generates an electric pulse and an electric pulse sequence based on the electric pulse for each of the detection photons of the detection rays of light. The apparatus includes an analog/digital converter for generating a digital data sequence by sampling the electric pulse sequence at a sampling speed.
Abstract translation: 要解决的问题：提供一种用于检查样品的方法和装置。 解决方案：公开了一种用于检查样品的方法和装置。 该装置包括：用于产生具有用激发脉冲频率连续产生的脉冲的激发光线的光源，用于用激发脉冲照射样本区域; 以及用于检测从样品区域发射的光的检测光的检测器。 在该装置中，检测器基于用于检测光线的每个检测光子的电脉冲产生电脉冲和电脉冲序列。 该装置包括用于通过以采样速度采样电脉冲序列来产生数字数据序列的模拟/数字转换器。 版权所有（C）2013，JPO＆INPIT
-
公开(公告)号：JP2012145939A
公开(公告)日：2012-08-02
申请号：JP2012001076
申请日：2012-01-06
Inventor： BIRK HOLGER , WIDZGOWSKI BERND , HOLGER NISSLE
CPC classification number: G02B21/008 , G01N21/6458 , G02B21/0076
Abstract: PROBLEM TO BE SOLVED: To provide a method and an apparatus which image a sample with a scanning microscopy.SOLUTION: Disclosed are a method and an apparatus for imaging a sample (28) with a scanning microscopy. Multiple sample points are scanned with a scanning beam (14) in consecutive scanning time sections. An intensity of light emitted from each of the scanned sample points is sensed repeatedly within each of the related scanning time sections. Based on intensities sensed at each of the scanned sample points, an intensity average value is found as an average value image point signal. Then, by synthesizing such average value image point signals, an average value raster image signal is generated. Further, in addition, based on intensities sensed at each of the scanned sample points, an intensity variance value is found as a variance image point signal. Then, by synthesizing such variance image point signals, a variance raster image signal is generated.
Abstract translation: 要解决的问题：提供一种用扫描显微镜对样品进行成像的方法和装置。 解决方案：公开了一种用扫描显微镜对样品（28）进行成像的方法和装置。 在连续扫描时间段内用扫描光束（14）扫描多个采样点。 在每个相关的扫描时间段内重复地感测从每个扫描的采样点发射的光的强度。 基于在每个扫描采样点处感测到的强度，发现强度平均值作为平均值图像点信号。 然后，通过合成这样的平均值图像点信号，生成平均值光栅图像信号。 此外，另外，基于在每个扫描采样点处感测到的强度，发现强度方差值作为方差图像点信号。 然后，通过合成这样的方差图像点信号，生成方差光栅图像信号。 版权所有（C）2012，JPO＆INPIT
-
公开(公告)号：JP2013104876A
公开(公告)日：2013-05-30
申请号：JP2012247351
申请日：2012-11-09
Inventor： WIDZGOWSKI BERND
IPC: G01N21/64
CPC classification number: G01N21/6408 , G01N21/6458 , G01N2201/0697 , G01N2201/12
Abstract: PROBLEM TO BE SOLVED: To provide a method for measurement of a lifetime of excitation state in a sample.SOLUTION: The invention relates to a method for measurement of a lifetime of excitation state, especially a fluorescence lifetime, in a sample, and relates to a device for executing the method. The method includes: a first step of generating an excitation pulse and illuminating a sample area with the excitation pulse; a second step of generating a first digital data sequence that shows a power and time profile of the excitation pulse, and determining a first switching moment on the basis of the first digital data sequence; a third step of using a detector to detect detection light emitted from the sample area, generating a second digital data sequence that shows a power and time profile of the detection light, and determining a second switching moment on the basis of the second digital data sequence; and a last step of calculating a time difference between the first and second switching moments.
Abstract translation: 要解决的问题：提供一种测量样品中激发态的寿命的方法。 解决方案：本发明涉及一种测量样品中激发态的寿命特别是荧光寿命的方法，涉及一种用于执行该方法的装置。 该方法包括：产生激励脉冲并用激励脉冲照射样本区域的第一步骤; 第二步骤，产生显示激励脉冲的功率和时间曲线的第一数字数据序列，以及基于第一数字数据序列确定第一切换时刻; 第三步骤，使用检测器来检测从样本区域发射的检测光，产生显示检测光的功率和时间曲线的第二数字数据序列，以及基于第二数字数据序列确定第二切换时刻 ; 以及计算第一和第二切换时刻之间的时间差的最后步骤。 版权所有（C）2013，JPO＆INPIT
-
Patent Agency Ranking
公开(公告)号：JP2013040939A
公开(公告)日：2013-02-28
申请号：JP2012180130
申请日：2012-08-15
Inventor： SCHREIBER FRANK , WIDZGOWSKI BERND , BIRK HOLGER
CPC classification number: H01L31/024 , H01J40/02 , H01J40/16 , H01J43/02 , H01J43/28
Abstract: PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is embodied so as to receive light and generate an electric signal, and has an optical sensor having a light incident surface and a cooling element. The cooling element comes into direct contact with the optical sensor on the light incidence surface of the optical sensor and/or a substrate that carries the optical sensor.
Abstract translation: 要解决的问题：提供一种检测装置。 解决方案：检测装置被实现为接收光并产生电信号，并且具有具有光入射表面和冷却元件的光学传感器。 冷却元件与光学传感器的光入射表面上的光学传感器和/或承载光学传感器的基板直接接触。 版权所有（C）2013，JPO＆INPIT
-
公开(公告)号：JP2013040938A
公开(公告)日：2013-02-28
申请号：JP2012180129
申请日：2012-08-15
Inventor： WIDZGOWSKI BERND
CPC classification number: H01L31/024 , H01J40/02 , H01J40/16 , H01J43/02 , H01J43/28
Abstract: PROBLEM TO BE SOLVED: To provide a detection device.SOLUTION: The detection device is so designed as to receive light and generate an electric signal, and has a housing and a detector which is constituted in the housing. The purpose of the configuration is that a cooling element may be constituted in the housing, an optical path that extends through the cooling element may be designated for the detection object light, and/or a cooling element designed as an intermediate element having thermal conductivity and electrical insulation may be constituted in the housing, and/or an optical sensor of the detector especially a cooling element coming into direct contact with a photocathode and/or the optical sensor especially the cooling element coming into direct contact with a (especially transparent) substrate that carries the photocathode may be constituted in the housing.
Abstract translation: 要解决的问题：提供一种检测装置。 解决方案：检测装置被设计成接收光并产生电信号，并且具有在壳体中构成的壳体和检测器。 该结构的目的在于，可以在壳体中构成冷却元件，延伸穿过冷却元件的光路可以用于检测对象光，和/或设计为具有导热性的中间元件的冷却元件， 电气绝缘可以在壳体中，和/或检测器的光学传感器，特别是与光电阴极和/或光学传感器直接接触的冷却元件，特别是与（特别是透明）基板直接接触的冷却元件 携带光电阴极的构造也可以在壳体内构成。 版权所有（C）2013，JPO＆INPIT
-
公开(公告)号：JP2007114764A
公开(公告)日：2007-05-10
申请号：JP2006255840
申请日：2006-09-21
Inventor： WIDZGOWSKI BERND , BIRK HOLGER
CPC classification number: G02B21/008 , G02B21/0036
Abstract: PROBLEM TO BE SOLVED: To provide an apparatus and a method for detection with a scanning microscope.
SOLUTION: The apparatus and the method for detection with the scanning microscope (1) are disclosed. The scanning microscope (1) encompasses a scanning device (7) that guides an illuminating light beam (3) through a scanning optical system (12) and a microscope optical system (13) and over or through a specimen (15). A digital circuit (30), which periodically interrogates the detected signals within a pixel (P
x, y ) and calculates an average therefrom, is placed after a detection unit (19).
COPYRIGHT: (C)2007,JPO&INPITAbstract translation: 要解决的问题：提供一种用扫描显微镜检测的装置和方法。 解决方案：公开了用扫描显微镜（1）进行检测的装置和方法。 扫描显微镜（1）包括通过扫描光学系统（12）和显微镜光学系统（13）引导照明光束（3）并穿过或穿过样本（15）的扫描装置（7）。 在检测单元（19）之后放置数字电路（30），其周期性地询问像素内的检测信号（P
x，y ）并计算其平均值。 版权所有（C）2007，JPO＆INPIT -
公开(公告)号：JP2007102235A
公开(公告)日：2007-04-19
申请号：JP2006274170
申请日：2006-10-05
Inventor： WIDZGOWSKI BERND
CPC classification number: G02B21/0048 , G02B21/0032 , G02B21/008 , G02B21/0084
Abstract: PROBLEM TO BE SOLVED: To create a scanning microscope with which image quality is improved, system-related artifacts being avoided, and to create a method of using such a scanning microscope. SOLUTION: A scanning microscope (1) and a scanning method are disclosed. The scanning microscope (1) has, arranged in the illuminating light beam path, an outcoupling element (60) that couples out at least a fraction of the illuminating light beam (3) and directs it to a detector (61), that detects the pulse frequency of the light source that generates the illuminating light beam; and the pulse frequency serves as a basic clock frequency for a scanner. COPYRIGHT: (C)2007,JPO&INPIT
Abstract translation: 要解决的问题：为了创建改善图像质量的扫描显微镜，避免了系统相关的伪像，并且创建使用这种扫描显微镜的方法。 解决方案：公开了扫描显微镜（1）和扫描方法。 扫描显微镜（1）在照明光束路径中布置有外耦合元件（60），该耦合元件将至少一部分照明光束（3）耦合并将其引导到检测器（61），检测器 产生照明光束的光源的脉冲频率; 并且脉冲频率用作扫描仪的基本时钟频率。 版权所有（C）2007，JPO＆INPIT
-
公开(公告)号：LT3423797T
公开(公告)日：2022-11-25
申请号：LT17054750
申请日：2017-03-01
Applicant: LEICA MICROSYSTEMS
Inventor： KRISHNAMACHARI VISHNU VARDHAN , MRAWEK PATRIC , WIDZGOWSKI BERND
-
-
-
-
-
-
-
-
-
Search Results
77
records
(took 0.057 seconds)
