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公开(公告)号：US11536939B2
公开(公告)日：2022-12-27
申请号：US17285104
申请日：2019-10-18
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Tobias Bauer
Abstract: A method is useable for digitally correcting an optical image of a sample by a microscope that has a cover slip covering the sample. The method includes: determining, by the microscope, an index of refraction of an optical medium bordering the cover slip, a tilt of the cover slip, and/or a thickness of the cover slip; ascertaining an imaging error to be corrected in the form of a pupil function based on the index of refraction of the optical medium, the tilt of the cover slip, and/or the thickness of the cover slip; carrying out imaging of the sample by the microscope; and digitally correcting image data captured by the imaging of the sample based on the pupil function.
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公开(公告)号：US20210373307A1
公开(公告)日：2021-12-02
申请号：US17285104
申请日：2019-10-18
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Tobias Bauer
Abstract: A method is useable for digitally correcting an optical image of a sample by a microscope that has a cover slip covering the sample. The method includes: determining, by the microscope, an index of refraction of an optical medium bordering the cover slip, a tilt of the cover slip, and/or a thickness of the cover slip; ascertaining an imaging error to be corrected in the form of a pupil function based on the index of refraction of the optical medium, the tilt of the cover slip, and/or the thickness of the cover slip; carrying out imaging of the sample by the microscope; and digitally correcting image data captured by the imaging of the sample based on the pupil function.
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3.发明授权Method and apparatus for identifying and correcting spherical aberrations in a microscope imaging beam path 有权用于识别和校正显微镜成像光束路径中的球面像差的方法和装置公开(公告)号：US08724103B2
公开(公告)日：2014-05-13
申请号：US13650170
申请日：2012-10-12
Applicant: Leica Microsystems CMS GmbH
Inventor： Werner Knebel , Tobias Bauer , Peter Euteneuer
CPC classification number: G01M11/02 , G02B21/241
Abstract: A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.
Abstract translation: 在使用具有目标的显微镜的样品的显微镜成像的上下文中，方法和装置提供了显微镜成像光束路径的球面误差的识别。 携带或覆盖样品的盖玻片布置在成像光束路径中。 将测量光束以物镜的光轴外的偏心方式引导到物体上。 测量光束在盖玻片与样品的界面处反射，反射的测量光束通过物镜被引导到检测器上。 用检测器检测反射的测量光束的强度分布，并且定性和/或定量地确定来自强度分布的球面误差的存在。
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公开(公告)号：US11630292B2
公开(公告)日：2023-04-18
申请号：US16300966
申请日：2017-05-12
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Albrecht Weiss , Tobias Bauer , Cornell Peter Gonschior
Abstract: An optical scanning microscope includes an illumination system having a light source portion emanating from a light source, first and second polarizing beam splitters, and first and second optical channels disposed between the beam splitters. The light source portion is configured to emit a first illumination light beam comprising light of a first main polarization direction and of a second main polarization direction. The first beam splitter is configured to guide the light primarily into the first and channels, respectively. The second beam splitter is configured to form a second illumination light beam from light of the first and second main polarization directions from the first channel and second channels, respectively. The first and second channels are configured to emit the light of the first and second main polarization directions from the first and second channels, respectively, so as to have different types of convergence.
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公开(公告)号：US10133063B2
公开(公告)日：2018-11-20
申请号：US15327659
申请日：2015-07-21
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schulz , Christian Schumann , Cornell Gonschior , Tobias Bauer
Abstract: A microscope includes at least one correction unit arranged in a beam path for correcting a variable spherical aberration. The correction unit has at least one optical correction element that is arranged in a convergent or divergent area of the beam path such that the optical correction element is movable along an optical axis. The at least one optical correction element has at least one correction surface. A part of the at least one correction surface through which the convergent or divergent area of the beam path passes forms a correction-effective surface section whose radial extension crosswise to the optical axis is adjustable by moving the correction element along the optical axis.
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Patent Agency Ranking
公开(公告)号：US20200319445A1
公开(公告)日：2020-10-08
申请号：US16300966
申请日：2017-05-12
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schumann , Albrecht Weiss , Tobias Bauer , Cornell Peter Gonschior
Abstract: An optical scanning microscope includes an illumination system having a light source portion emanating from a light source, first and second polarizing beam splitters, and first and second optical channels disposed between the beam splitters. The light source portion is configured to emit a first illumination light beam comprising light of a first and of a second main polarization direction. The first beam splitter is configured to guide the light of the first and second main polarization direction primarily into the first and channels, respectively. The second beam splitter is configured to form a second illumination light beam from light of the first and second main polarization directions from the first channel and second channels, respectively. The first and second channels are configured to emit the light of the first and second main polarization directions from the first and second channels, respectively, so as to have different convergence angles.
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公开(公告)号：US09772482B2
公开(公告)日：2017-09-26
申请号：US14437508
申请日：2013-10-22
Applicant: LEICA MICROSYSTEMS CMS GMBH
Inventor： Christian Schumann , Ralf Krueger , Tobias Bauer , Arnold Mueller-Rentz , Klaus Hermanns , Christian Schulz
IPC: G02B21/06 , G02B21/08 , G02B21/18 , F21V33/00 , G01N21/31 , F21Y103/00 , F21Y105/00 , F21Y115/20 , F21Y115/15
CPC classification number: G02B21/06 , F21V33/0068 , F21Y2103/00 , F21Y2105/00 , F21Y2115/15 , F21Y2115/20 , G01N21/31 , G01N2201/061 , G01N2201/0628 , G02B21/088 , G02B21/18
Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.
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公开(公告)号：US09671601B2
公开(公告)日：2017-06-06
申请号：US13962136
申请日：2013-08-08
Applicant: Leica Microsystems CMS GmbH
Inventor： Ralf Krueger , Tobias Bauer
CPC classification number: G02B21/06 , G02B21/006 , G02B21/242 , G02B21/244 , G02B21/245 , G03B13/36 , G03F9/7026
Abstract: A method for autofocusing in microscopic examination of a specimen located at the focus of a microscope objective uses an autofocus beam path, the autofocus beam path being directed, via a deflection device arranged on the side of the microscope objective facing away from the specimen, toward the microscope objective, and from there onto a reflective autofocus interface in the specimen region. The autofocus beam path is reflected at the autofocus interface and directed via the microscope objective and the deflection device toward an autofocus detector. The deflection device comprises two regions spaced apart from one another in a propagation direction of the autofocus beam path. Each region reflects the autofocus beam path. The autofocus detector is arranged in a plane conjugated with the microscope objective pupil to acquire an interference pattern. The focus of the microscope is adjusted as a function of the acquired interference pattern.
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公开(公告)号：US09488818B2
公开(公告)日：2016-11-08
申请号：US14191557
申请日：2014-02-27
Applicant: Leica Microsystems CMS GmbH
Inventor： Tobias Bauer , Christian Schulz
Abstract: A microscope immersion objective having a numerical aperture of NA>1.36 includes a front lens group. The front lens group has a first, object-side optical element having a plane parallel plate and a second optical element having a hyper-hemisphere. The plane parallel plate is wrung together with a planar side of the hyper-hemisphere.
Abstract translation: 具有数值孔径NA> 1.36的显微镜浸没物镜包括前透镜组。 前透镜组具有具有平面平行板的第一物体侧光学元件和具有超半球的第二光学元件。 平面平行板与超半球的平面侧一起拧紧。
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公开(公告)号：US20170192227A1
公开(公告)日：2017-07-06
申请号：US15327659
申请日：2015-07-21
Applicant: Leica Microsystems CMS GmbH
Inventor： Christian Schulz , Christian Schumann , Cornell Gonschior , Tobias Bauer
CPC classification number: G02B27/0068 , G02B3/04 , G02B6/0005 , G02B13/18 , G02B21/0032 , G02B21/02 , G02B21/06 , G02B27/0037 , G02B27/0955 , G02B27/425
Abstract: A microscope includes at least one correction unit arranged in a beam path for correcting a variable spherical aberration. The correction unit has at least one optical correction element that is arranged in a convergent or divergent area of the beam path such that the optical correction element is movable along an optical axis. The at least one optical correction element has at least one correction surface. A part of the at least one correction surface through which the convergent or divergent area of the beam path passes forms a correction-effective surface section whose radial extension crosswise to the optical axis is adjustable by moving the correction element along the optical axis.
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