MANUFACTURING PROCESS OF DEVICE CONTAINING LEAD ZIRCONATE TITANATE

    公开(公告)号:JP2000199049A

    公开(公告)日:2000-07-18

    申请号:JP22897699

    申请日:1999-08-13

    Abstract: PROBLEM TO BE SOLVED: To provide a device which is capable of easily forming an oriented Perovskite layer to show the specified piezoelectric coefficient by depositing a template layer on a substrate of diamond, etc., by a vapor phase deposition method, and depositing a lead zirconate titanate layer thereon by the vapor phase deposition method. SOLUTION: A template layer is deposited on a substrate formed of diamond, silicon, platinum-covered material, etc., by a physical or chemical vapor phase deposition method. The template layer is preferably formed of lead titanate, strontium titanate, barium titanate, etc., of about 0.06-0.12 μm in thickness. A lead zirconate titanate(PZT) layer is deposited thereon by the physical or chemical deposition method. The PZT layer has the dielectric constant of about 500-650 at 1 V and 100 kHz, and is preferably formed to be about 0.1-10 μm in thickness. The PZT layer easily forms an oriented Perovskite layer of about 50×10-12 to 350×10-12 m/V in piezoelectric coefficient through the template layer of Perovskite structure.

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