METHOD FOR POSITIONING OPTICAL SUB-ASSEMBLY FOR TEST

    公开(公告)号:JPH09197198A

    公开(公告)日:1997-07-31

    申请号:JP34144896

    申请日:1996-12-20

    Abstract: PROBLEM TO BE SOLVED: To provide an optical sub-assembly positioning method for test. SOLUTION: In the method, the positioning of an optical sub-assembly 10 within a capture zone on the supporting face 40 of a fixing device for test is executed for a test. At least two probes 50 are engaged with the surfaces of respective reference faces 30, 34, 36, 38 accurately positioned on the surface of the sub-assembly 10. In a sutable example, a 3rd probe is brought into contact with one surface 16 of the sub-assembly 10 which is another reference face on the surface of the sub-assembly 10. When the probes 50 and the 3rd probe are engaged with the surfaces of respective reference faces and furthermore, moved in the directions of respective reference faces, the sub-assembly 10 is moved in parallel so as to more accurately match with an optical system in the fixing device for the test.

    Method for positioning optical subassembly for testing
    4.
    发明公开
    Method for positioning optical subassembly for testing 失效
    一种用于定位的光学子组件进行测试方法

    公开(公告)号:EP0782024A3

    公开(公告)日:1998-11-11

    申请号:EP96309119

    申请日:1996-12-13

    CPC classification number: G02B6/422 G01B11/002 G02B6/4224

    Abstract: There is disclosed a method of positioning an optical subassembly (10) for testing includes positioning an optical subassembly (10) within a capture zone on a support surface (40) of a test fixture. At least two probes (50) engage surfaces of respective ones of precisely located fiducials (30, 34, 36, 38) in a surface of the optical subassembly. A third probe (72) contacts a surface (16) of the optical subassembly, which in a preferred embodiment may be another fiducial in the surface of the optical subassembly. Upon engagement of the probes (50, 72) with surfaces (58) of respective fiducials and movement of the probes further into respective fiducials, the optical subassembly is translated into more precise alignment with optics of the test fixture.

Patent Agency Ranking