Abstract:
The invention relates to a method for determining isotropic stress by means of a Hall element which has a plate-shaped area made of a doped semiconductor material and comprises four contacts contacting the plate-shaped area. The contacts form corners of a quadrangle, two neighbouring corners of the quadrangle defining an edge thereof. The method comprises determining at least one van der Pauw transresistance value in at least one van der Pauw measurement set-up of the Hall element, wherein the four contacts of the Hall element form contact pairs, a contact pair comprising two contacts which are neighbouring corners of the quadrangle. In this set-up, one contact pair is used for supplying a current and the other contact pair is used for measuring a voltage. A relationship between the supplied current and the measured voltage defines the Van der Pauw transresistance value. The method furthermore comprises determining a stress signal which depends at least on the at least one Van der Pauw transresistance value, and determining the isotropic stress by comparing the determined stress signal with a predetermined reference stress signal which is temperature-dependent.
Abstract:
A method for providing offset compensation in a Hall sensor (100) comprising at least one Hall element (101) having a plate-shaped sensor element made of a doped semiconductor material, comprises using measurements on the Hall element itself. The method comprises obtaining a first readout signal (VH) from the at least one Hall element which is substantially dependent on the magnetic field, obtaining a second readout signal (VP) from the at least one Hall element which is substantially independent of the magnetic field, and using the second readout signal (VP) for obtaining a prediction (Vo ) of the offset (Vo) on the first readout signal (VH).
Abstract:
A method for providing offset compensation in a Hall sensor comprising at least one Hall element having a plate-shaped sensor element made of a doped semiconductor material, comprises using measurements on the Hall element itself. The method comprises obtaining a first readout signal (VH) from the at least one Hall element which is substantially dependent on the magnetic field, obtaining a second readout signal (VP) from the at least one Hall element which is substantially independent of the magnetic field, and using the second readout signal (VP) for obtaining a prediction ({circumflex over (V)}O) of the offset (VO) on the first readout signal (VH).
Abstract:
The present invention provides a difference measurement circuit (60) comprising a first port (P1, P1') and a second port (P2, P2') for connection to a first set of nodes (A, B) and a second set of nodes (C, D) of a sensor unit. The circuit (60) further comprises switching units (61, 62) for switching excitation signals emanating from excitation nodes (C', D') from being applied to the first set of nodes (A, B) via the first port (P1, P1') to being applied to the second set of nodes (C, D) via the second port (P2, P2') and for switching differential measurement signals measured at sensing nodes (A', B') from being obtained from the second set of nodes (C, D) via the second port (P2, P2') to being obtained from the first set of nodes (A, B) via the first port (P1, P1'). The present invention also provides a corresponding method. The circuit (60) further comprises redundancy testing circuitry for evaluating the similarity or deviation between measurement signals obtained in different states of the switching units (61, 62).
Abstract:
The method involves measuring a Van der Pauw value in a Van der Pauw measurement setup of the hall element (1). A sheet resistance factor is calculated from the Van der Pauw value. The stress value is calculated which depends on the sheet resistance factor. Two Van der Pauw values are measured in the two Van der Pauw measurement setup of the hall element and two diagonal pressures are measured in the two diagonal measurement setup. The latter Van der Pauw value is calculated from the former Van der Pauw value and the difference of the two diagonal pressures. Independent claims are included for the following: (1) a method for determining a component of a magnetic field; (2) a stress sensor for the measurement of isotropic stress; and (3) a Hall sensor for the measurement of a component of a magnetic field.
Abstract:
A method for providing offset compensation in a Hall sensor comprising at least one Hall element having a plate-shaped sensor element made of a doped semiconductor material, comprises using measurements on the Hall element itself. The method comprises obtaining a first readout signal (VH) from the at least one Hall element which is substantially dependent on the magnetic field, obtaining a second readout signal (VP) from the at least one Hall element which is substantially independent of the magnetic field, and using the second readout signal (VP) for obtaining a prediction ({circumflex over (V)}O) of the offset (VO) on the first readout signal (VH).