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1.
公开(公告)号:JP2003234413A
公开(公告)日:2003-08-22
申请号:JP2002346552
申请日:2002-11-28
Applicant: MEMSCAP
Inventor: GIRARDIE LIONEL , DAVID JEAN-BAPTISTE
IPC: H01F17/00 , H01F41/04 , H01L21/3205 , H01L21/822 , H01L23/52 , H01L23/522 , H01L23/532 , H01L27/04
Abstract: PROBLEM TO BE SOLVED: To provide a method of manufacturing an electronic component incorporated with a guidance micro component disposed on a substrate. SOLUTION: This component includes continuous layers (10, 10a) of a substance with a low relative dielectric constant, which are isolated by a hard mask layer (12) and lie on the upper surface of a substrate (1), a multiplicity of metallic bent portions (30-31) defined on the continuous layers (10, 10a) of a substance with a low relative dielectric constant, and a copper-diffused barrier layer (15) sandwiched between the metallic bent portions (30-31) and the layers of a substance with a low relative dielectric constant, which is disposed immediately under this layer. The substrate (1) is a semiconductor substrate, or a glass or quartz-type amorphous substrate for forming an integrated circuit. The substance with a low relative dielectric constant deposited on the substrate (1) is preferably benzocyclobutene. COPYRIGHT: (C)2003,JPO
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2.
公开(公告)号:JP2003234412A
公开(公告)日:2003-08-22
申请号:JP2002346551
申请日:2002-11-28
Applicant: MEMSCAP
Inventor: GIRARDIE LIONEL , DAVID JEAN-BAPTISTE
IPC: H01L21/768 , H01L21/02 , H01L21/288 , H01L21/3205 , H01L21/822 , H01L23/12 , H01L23/15 , H01L23/52 , H01L23/522 , H01L27/04 , H01L27/08
Abstract: PROBLEM TO BE SOLVED: To provide a method of manufacturing an electronic component incorporated with a guidance micro component disposed on a substrate. SOLUTION: This component includes a layer (10) of a substance with a low relative dielectric constant formed on the upper surface of a substrate (1), a multiplicity of metallic bent portions (30-31) defined on the layer (10) of a substance with a low relative dielectric constant, and a copper-diffused barrier layer (15) sandwiched between the metallic bent portions (30-31) and the layer (10) of a substance with a low relative dielectric constant. The substrate (1) is a semiconductor substrate, or a glass or quartz-type amorphous substrate for forming an integrated circuit. The substance with a low relative dielectric constant deposited on the substrate (1) is preferably benzocyclobutene. COPYRIGHT: (C)2003,JPO
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3.
公开(公告)号:JP2003234414A
公开(公告)日:2003-08-22
申请号:JP2002351667
申请日:2002-12-03
Applicant: MEMSCAP
Inventor: GIRARDIE LIONEL , DAVID JEAN-BAPTISTE
IPC: H01F17/00 , H01L21/02 , H01L21/285 , H01L21/3205 , H01L21/768 , H01L21/822 , H01L23/52 , H01L27/04 , H01L27/08
Abstract: PROBLEM TO BE SOLVED: To provide a method of manufacturing an electronic component incorporated with a guidance micro component disposed on a substrate. SOLUTION: This component includes at least one laminate composed of a first layer (10) of a substance with a low relative dielectric constant, which is located on the upper surface of a substrate (1), and a hard mask layer, a multiplicity of metallic bent portions (39) formed on continuous layers (10, 10a) of a substance with a low relative dielectric constant, and a copper-diffused barrier layer (35), which exists on a low-lying surface and a side surface of the metallic bent portions (39). The substrate (1) is a semiconductor substrate, or a glass or quartz-type amorphous substrate for forming an integrated circuit. The substance with a low relative dielectric constant deposited on the substrate (1) is preferably benzocyclobutene. COPYRIGHT: (C)2003,JPO
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4.
公开(公告)号:CA2409241A1
公开(公告)日:2003-06-11
申请号:CA2409241
申请日:2002-10-21
Applicant: MEMSCAP
Inventor: DAVID JEAN-BAPTISTE , GIRARDIE LIONEL
IPC: H01F17/00 , H01L21/02 , H01L21/285 , H01L21/3205 , H01L21/768 , H01L21/822 , H01L23/52 , H01L27/04 , H01L27/08 , H01F37/00 , H01F41/00 , H01L49/02
Abstract: L'invention concerne un procédé permettant de fabriquer des composants électroniques incorporant un micro-composant inductif, disposé au dessus d'u n substrat. Un tel composant comporte: - au moins une superposition d'une couche (10, 10a) de matériau à faible permittivité relative et d'une couche de masque dur, la première couche (10) de matériau à faible permittivité relative reposant sur la face supérieure du substrat (1) ; - un ensemble de spires métalliques (39), définies au-dessus de la superposition de couches (10, 10a) de matériau à faible permittivité relative; - une couche (35) barrière à la diffusion du cuivre, présente sur les faces inférieure et latérales des spires métalliques (39).
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5.
公开(公告)号:CA2409237A1
公开(公告)日:2003-05-29
申请号:CA2409237
申请日:2002-10-21
Applicant: MEMSCAP
Inventor: GIRARDIE LIONEL , DAVID JEAN-BAPTISTE
IPC: H01L21/768 , H01L21/02 , H01L21/288 , H01L21/3205 , H01L21/822 , H01L23/12 , H01L23/15 , H01L23/52 , H01L23/522 , H01L27/04 , H01L27/08 , H01F37/00 , H01L21/70 , H01L49/02
Abstract: L'invention concerne un procédé permettant de fabriquer des composants électroniques incorporant un micro-composant inductif, disposé au dessus d' un substrat. Un tel composant comporte: - une couche (10) de matériau à faible permittivité relative, reposant sur la face supérieure du substrat (1); - un ensemble de spires métalliques (30-31), définies au-dessus de la couche (10) de matériau à faible permittivité relative; - une couche (15) barrière à la diffusion du cuivre, interposée entre les spires métalliques (30-31) et la couche de matériau à faible permittivité relative.
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6.
公开(公告)号:CA2409232A1
公开(公告)日:2003-05-29
申请号:CA2409232
申请日:2002-10-21
Applicant: MEMSCAP
Inventor: GIRARDIE LIONEL , DAVID JEAN-BAPTISTE
IPC: H01F17/00 , H01F41/04 , H01L21/3205 , H01L21/822 , H01L23/52 , H01L23/522 , H01L23/532 , H01L27/04 , H01F37/00 , H01L49/02 , H01L21/64
Abstract: L'invention concerne un procédé permettant de fabriquer des composants électroniques incorporant un micro-composant inductif, disposé au dessus d' un substrat. Un tel composant comporte: - une succession de couches (10, 10a) de matériau à faible permittivité relative séparées par des couches de masque dur (12), la première couche de matériau à faible permittivité relative, reposant sur la face supérieure du substrat (1); - un ensemble de spires métalliques (30-31), définies au-dessus de la succession de couches (10, 10a) de matériau à faible permittivité relative; - une couche (15) barrière à la diffusion du cuivre, interposée entre les spires métalliques (30-31) et la couche sous-jacente de matériau à faible permittivité relative.
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