Abstract:
PROBLEM TO BE SOLVED: To uniformize a system read latency of a memory device for the purpose of reducing complexity of a memory controller. SOLUTION: By a control circuit 2000, after receiving the flag signal by the control circuit, a memory device begins to output data associated with a previously received command onto at least one data signal line from a memory array in the predetermined number of read clock cycles, and the aforementioned number of read clock cycles is preliminarily determined according to a feature of signal propagation in order to equalize it to the read latency of the memory device. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a memory device equalizing the system read latencies of every memory device in a high speed memory system. SOLUTION: In a high speed memory subsystem, differences in each memory device's minimum device read latency and differences in signal propagation time between the memory device and a memory controller results in widely varying system read latencies. The differences in system read latencies of each device are thereby compared, and each memory device is operated with a device system read latency which causes every device to exhibit the same system read latency. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a memory adaptable to either a memory having high speed narrow data bus width or a memory having low speed wide data bus width.SOLUTION: In either mode of high speed or low speed, 32-bits data from each of two memory arrays are pre-fetched into respective sets of 32 flip-flops 120. In the high speed mode, the pre-fetched data bits are transferred in parallel to four parallel-to-serial converters 150a. The converters transform the parallel data bits to a burst of eight serial data bits and apply the burst to each of four data bus terminals 160. In the low speed mode, two sets of pre-fetched data bits are transferred in parallel to eight parallel-to serial converters. The converters transform the parallel data bits to a burst of eight serial data bits and apply the burst to each of eight data bus terminals.
Abstract:
PROBLEM TO BE SOLVED: To provide a method and apparatus for accurately determining the actual arrival of data at a memory device relative to the write clock to accurately align the start of data capture and the arrival of the data at the memory device. SOLUTION: The actual time of arrival of data at the inputs to the memory device is determined by sending back-to-back write commands along with a predetermined data pattern to the memory device. The data pattern is stored in a register and any difference between the predicted arrival time of the data and the actual arrival time of the data is determined by logic circuitry. Any determined difference can then be compensated for by delaying the start of the capture of the data at the memory device, thereby accurately aligning the start of the data capture and the arrival of the data at the memory device. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide solid state storage devices and methods for flash translation layers.SOLUTION: In one translation layer, a sector indication is translated to a memory location by a parallel unit look-up table configured by memory device enumeration at initialization. Each table entry comprises communication channel information, chip enable information, logical unit information and plane information, for each operating memory device found. When the sector indication is received, a modulo function operates on entries of the look-up table in order to determine the memory location associated with the sector indication.
Abstract:
PROBLEM TO BE SOLVED: To provide a memory data bus being operable as either a high-speed narrow data bus or a low speed wide data bus. SOLUTION: In either mode, 32 bits of data from each of two memory arrays are pre-fetched into respective sets of 32 flip-flop 120. In high-speed mode, the pre-fetched data bits are transferred in parallel to four parallel-to-serial converters 150a, which transform the parallel data bits to a burst of eight serial data bits and apply the burst to a respective one of four data bus terminals 160. In the low speed mode, two sets of pre-fetched data bits are transferred in parallel to eight parallel-to serial converters, which transform the parallel data bits to a burst of eight serial data bits and apply the burst to a respective one of eight data bus terminals. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a clock circuit for generating an internal clock signal synchronized to an external clock signal. SOLUTION: A clock generator circuit for an integrated circuit comprised of a phase-locked loop (PLL) includes a phase detector comparing the phase of a delayed external clock signal with the phase of an internal clock signal. An error signal corresponding to the difference in phase between the two clock signals is applied to a differential amplifier where the error signal is offset by a value corresponding to the delay of an external clock signal when it is coupled to the phase detector. The offset error signal is applied to a control input of a voltage controlled oscillator which generates the internal clock signal. The phase of the internal clock signal is thus adjusted so that it may be substantially the same as the phase of the external clock signal. The voltage controlled oscillator is constructed to operate in a plurality of discrete frequency bands so that the offset error signal may need to only control the frequency of the internal clock signal over a relatively small range. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a high-speed counter circuit which produces digital counts, with a plurality of bits to control the timing of operations in a memory device. SOLUTION: A counter circuit includes a series of registers driven by two phase shifted clocks. A clock generator in the counter circuit generates four asymmetric clock signals for driving each of the registers. The registers are formed from input and output stages, each having two sets of switches. The first set of switches in each stage provides a supply voltage to a stage output, in response to the asymmetric clocks. The second set of switches supplies a ground to the stage output, in response to the asymmetric clocks. To accelerate response of the switching circuits, isolation switches decouple the first set of switches in each pair from the stage output during switching of the second set of switches, thereby removing the load of stage output due to the second set of switches. COPYRIGHT: (C)2007,JPO&INPIT