公开(公告)号：AU6318298A

公开(公告)日：1998-09-18

申请号：AU6318298

申请日：1998-01-29

Applicant: MICROSCAN SYSTEMS INC

Inventor： KING STEVEN JOSEPH ,  LUDLOW JONATHAN EDMUND ,  SCHURR GEORGE

IPC: G01B11/03 ,  G01N21/88 ,  G01N21/956 ,  G06T1/00 ,  H05K13/08

Abstract: The present invention relates to inspection systems and methods, and in particular to a method for inspecting surfaces and objects using a ring illumination apparatus. A reflected image from the inspected surface or object includes a pattern of reflected image elements representing a pattern of illuminated reflective elements on an article. The method comprises the steps of: locating this pattern of reflected image elements in the reflected image; dividing at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in the reflected image element; positioning at least one vector across the reflected image element; examining a series of pixels along said at least one vector in order to determine at least one dimension or feature of the reflected image element; and determining inspection information pertaining to the illuminated reflective element represented by said at least one reflected image element using said determined at least one dimension or feature.