公开(公告)号：EP0250959B1

公开(公告)日：1992-05-13

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

公开(公告)号：EP0250959A3

公开(公告)日：1989-09-13

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

Abstract: A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a second­ary reflectance standard for several wavelengths are calculated and stored in a memory of a reflec­tance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample.

公开(公告)号：EP0250959A2

公开(公告)日：1988-01-07

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

Abstract: A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a second­ary reflectance standard for several wavelengths are calculated and stored in a memory of a reflec­tance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample.

Abstract translation: 校准具有自动增益或灵敏度设定能力的反射测量装置（如分光光度计）的方法。 根据该方法，计算出几个波长的二次反射率标准的偏移反射率和反射率，并将其存储在反射测量装置的存储器中。 在反射测量装置中安装二级标准，并且在测量样品的反射率之前读取来自二级标准的选定波长处的反射率。 使用存储的偏移反射率和工作波长的二次反射率来计算测试样品的真实反射率。