公开(公告)号：EP0250959B1

公开(公告)日：1992-05-13

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

公开(公告)号：EP0177861A2

公开(公告)日：1986-04-16

申请号：EP85112315.8

申请日：1985-09-28

Applicant: MILES INC.

Inventor： Hernicz, Ralph S.

IPC: G01N21/27 ,  G01N21/25 ,  G01N21/47

CPC classification number: G01N21/474 ,  G01N2021/4742 ,  G01N2021/478 ,  G01N2201/065

Abstract: A read head with reduced height sensitivity for use in a reflectance photometer that measures reflectance of diffuse light from a sample disposed outside the readhead includes a housing with an upper spherical portion and a lower conical portion. The inner peripheral surface of the upper portion is hemispherically configured and the inner peripheral surface of the lower portion is conically configured to permit illumination of a sample disposed outside the readhead. The angle of the cone defined in the conical portion of the housing is in the range of 45°-60°. The inner peripheral surfaces of the upper and lower portions are coated with a highly reflective material, such as barium sulfate. The apex of the conically configured housing portion is truncated to provide a light transmitting aperture for sample illumination. A sample is positioned adjacent the light-transmitting aperture below and outside the conically shaped readhead housing portion. The housing includes a second aperture for receiving a high intensity light from a flash lamp or incandescent light to illuminate the interior of the housing and diffusely illuminate the sample. A baffle is located adjacent the second aperture to avoid direct illumination of the sample. Fiberoptic bundles and photodetectors as well as lenses and reflecting surfaces are provided to detect the amount of diffuse light reflected from the sample.

公开(公告)号：EP0125340A2

公开(公告)日：1984-11-21

申请号：EP83110396.5

申请日：1983-10-19

Applicant: MILES INC.

Inventor： Brunsting, Albert ,  Hernicz, Ralph S. ,  Pugh, Jerry T.

IPC: G01N21/47 ,  G01N21/55

CPC classification number: G01N21/474 ,  G01N2021/478

Abstract: Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which one or more light sources and one or more detectors are mounted together on the same plane surface in close proximity to each other at an angle (φ) from the normal to the surface of the specimen holder. Angle (φ) is selected such that the specular reflection at the surface of the specimen is insignificant compared to the minimum diffused reflection expected from the specimen.

Abstract translation: 公开了一种用于获得非特异性反射光的测量的反射装置，其中一个或多个光源和一个或多个检测器以相对于彼此的法线表面的角度（phi）彼此靠近地安装在同一平面上， 样品架。 角度（phi）被选择为使得与样本预期的最小扩散反射相比，样品表面的镜面反射是不显着的。

公开(公告)号：EP0125340B1

公开(公告)日：1988-01-07

申请号：EP83110396.5

申请日：1983-10-19

Applicant: MILES INC.

Inventor： Brunsting, Albert ,  Hernicz, Ralph S. ,  Pugh, Jerry T.

IPC: G01N21/47 ,  G01N21/55

CPC classification number: G01N21/474 ,  G01N2021/478

公开(公告)号：EP0177861B1

公开(公告)日：1989-11-15

申请号：EP85112315.8

申请日：1985-09-28

Applicant: MILES INC.

Inventor： Hernicz, Ralph S.

IPC: G01N21/27 ,  G01N21/25 ,  G01N21/47

CPC classification number: G01N21/474 ,  G01N2021/4742 ,  G01N2021/478 ,  G01N2201/065

公开(公告)号：EP0250959A3

公开(公告)日：1989-09-13

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

Abstract: A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a second­ary reflectance standard for several wavelengths are calculated and stored in a memory of a reflec­tance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample.

公开(公告)号：EP0250959A2

公开(公告)日：1988-01-07

申请号：EP87108370.5

申请日：1987-06-10

Applicant: MILES INC.

Inventor： Cooper, David M. ,  Hernicz, Ralph S.

IPC: G01N21/47

CPC classification number: G01N21/4785

Abstract: A method of calibrating reflectance measuring devices, such as spectrophotometers, that incorporate automatic gain or sensitivity setting capability. According to the method, offset reflectance and reflectance of a second­ary reflectance standard for several wavelengths are calculated and stored in a memory of a reflec­tance measuring device. A secondary standard is mounted in the reflectance measuring device and reflectances at a selected wavelengths from the secondary standard are read prior to measurement of the reflectance of the test sample. The stored offset reflectance and secondary reflectance for the operational wavelength are used to calculate true reflectance of the test sample.

Abstract translation: 校准具有自动增益或灵敏度设定能力的反射测量装置（如分光光度计）的方法。 根据该方法，计算出几个波长的二次反射率标准的偏移反射率和反射率，并将其存储在反射测量装置的存储器中。 在反射测量装置中安装二级标准，并且在测量样品的反射率之前读取来自二级标准的选定波长处的反射率。 使用存储的偏移反射率和工作波长的二次反射率来计算测试样品的真实反射率。