1.
    发明专利
    未知

    公开(公告)号:DE60132665D1

    公开(公告)日:2008-03-20

    申请号:DE60132665

    申请日:2001-04-17

    Applicant: MOTOROLA INC

    Abstract: A wireless, programmable system for medical monitoring includes a base unit and a plurality of individual wireless, remotely programmable biosensor transceivers. The base unit manages the transceivers by issuing registration, configuration, data acquisition, and transmission commands using wireless techniques. Physiologic data from the wireless transceivers is demultiplexed and supplied via a standard interface to a conventional monitor for display. Initialization, configuration, registration, and management routines for the wireless transceivers and the base unit are also described.

    METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS
    10.
    发明申请
    METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS 审中-公开
    使用X射线微观分析法确定复合结构化学成分的方法

    公开(公告)号:WO2006057744A2

    公开(公告)日:2006-06-01

    申请号:PCT/US2005038033

    申请日:2005-10-21

    Abstract: A method for identifying hazardous substances in a printed wiring assembly having a plurality of discrete components, using micro X-ray fluorescence spectroscopy. A micro X-ray fluorescence spectroscopy (µ-XRF) and/or X-ray Absorption Fine Structure (XAFS) spectroscopy are used as detecting analyzers, to identify materials of concern in an electronic device. The device or assembly to be examined is analyzed by moving it in the X, Y, and Z directions under a probe in response to information in a reference database, to determine elemental composition at selected locations on the assembly, the probe positioned at an optimum analytical distance from each selected location for analysis. The determined elemental composition at each selected location is then correlated to the reference database, and the detected elements are assigned to the various components in the assembly.

    Abstract translation: 一种使用微X射线荧光光谱法鉴定具有多个分立元件的印刷线路组件中的有害物质的方法。 使用微X射线荧光光谱(μ-XRF)和/或X射线吸收精细结构(XAFS)光谱作为检测分析仪,以识别电子设备中关注的材料。 要检查的设备或组件是通过在探针下在X,Y和Z方向上移动来响应于参考数据库中的信息来分析的,以确定组件上选定位置处的元素组成,探针定位在最佳状态 从每个选定位置的分析距离进行分析。 然后将确定的每个选定位置的元素组成与参考数据库相关联,并将检测到的元素分配给组件中的各种组件。

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