PLASMA TREATING OF A CHEMICAL SPECIES

    公开(公告)号:AU2003238261A1

    公开(公告)日:2004-01-19

    申请号:AU2003238261

    申请日:2003-06-18

    Applicant: MOTOROLA INC

    Abstract: A method of treating a first chemical species in a gas using a plasma, the method including the steps of providing an array of micro-scale cavity discharge devices capable of sustaining the plasma where the first chemical species is capable of flowing proximate to the array of micro-scale cavity discharge devices, wherein the first chemical species is converted to a second chemical species within the plasma.

    Electrode design for stable micro-scale plasma discharges

    公开(公告)号:AU2003240520A8

    公开(公告)日:2003-12-31

    申请号:AU2003240520

    申请日:2003-06-04

    Applicant: MOTOROLA INC

    Inventor: VONALLMEN PAUL A

    Abstract: A microcavity plasma discharge device comprising a micro-cavity device structure which includes N dielectric material structures wherein N is a whole number greater than or equal to one, each N dielectric material structure including a dielectric spacer region with a first opening wherein the dielectric spacer region is sandwiched therebetween a first dielectric material region with a second opening and a second dielectric material region with a third opening wherein the second opening and the third opening are positioned adjacent to the first opening to form a trench with a width and wherein a first conductive material layer is sandwiched between the dielectric spacer region and the first dielectric material region and a second conductive material layer is sandwiched between the dielectric spacer region and the second dielectric material region.

    ELECTRODE DESIGN FOR STABLE MICRO-SCALE PLASMA DISCHARGES

    公开(公告)号:AU2003240520A1

    公开(公告)日:2003-12-31

    申请号:AU2003240520

    申请日:2003-06-04

    Applicant: MOTOROLA INC

    Inventor: VONALLMEN PAUL A

    Abstract: A microcavity plasma discharge device comprising a micro-cavity device structure which includes N dielectric material structures wherein N is a whole number greater than or equal to one, each N dielectric material structure including a dielectric spacer region with a first opening wherein the dielectric spacer region is sandwiched therebetween a first dielectric material region with a second opening and a second dielectric material region with a third opening wherein the second opening and the third opening are positioned adjacent to the first opening to form a trench with a width and wherein a first conductive material layer is sandwiched between the dielectric spacer region and the first dielectric material region and a second conductive material layer is sandwiched between the dielectric spacer region and the second dielectric material region.

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